Serially connected tantalum and amorphous indium tin oxide for sensing the temperature increase in IGZO thin-film transistor backplanes
Yu, EunSeong, Kim, SeoungGyun, Kang, SeoJin, Lee, HyuckSu, Moon, SeungJae, Lee, JongMo, An, SeungBae, Bae, ByungSeong
Published in Journal of Information Display (03.07.2023)
Published in Journal of Information Display (03.07.2023)
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