On the impact of substrate electron injection on dynamic Ron in GaN-on-Si HEMTs
Pagnano, Dario, Longobardi, Giorgia, Udrea, Florin, Sun, Jinming, Imam, Mohamed, Garg, Reenu, Kim, Hyeongnam, Charles, Alain
Published in Microelectronics and reliability (01.09.2018)
Published in Microelectronics and reliability (01.09.2018)
Get full text
Journal Article
Temperature Dependence of Electron Transport in ZnO Nanowire Field Effect Transistors
Shao, Ye, Yoon, Jongwon, Kim, Hyeongnam, Lee, Takhee, Lu, Wu
Published in IEEE transactions on electron devices (01.02.2014)
Published in IEEE transactions on electron devices (01.02.2014)
Get full text
Journal Article
Analysis of surface states in ZnO nanowire field effect transistors
Shao, Ye, Yoon, Jongwon, Kim, Hyeongnam, Lee, Takhee, Lu, Wu
Published in Applied surface science (15.05.2014)
Published in Applied surface science (15.05.2014)
Get full text
Journal Article
Conference Proceeding
Reverse bias lifetime reliability assessments of HV GaN power device
Veereddy, Deepak, Khalil, Sameh G., Kannan, Hari, Dip, Andrew, Hyeongnam Kim, Zhaofeng Wang, Crandell, Mark, Imam, Mohamed, McDonald, Tim, Charles, Alain
Published in 2017 IEEE International Reliability Physics Symposium (IRPS) (01.04.2017)
Published in 2017 IEEE International Reliability Physics Symposium (IRPS) (01.04.2017)
Get full text
Conference Proceeding
Influence of CdS heat treatment on the microstructure of CdS and the performance of CdS/CdTe solar cells
Get full text
Journal Article
Conference Proceeding
Passivation of surface and interface states in AlGaN/GaN HEMT structures by annealing
KIM, Hyeongnam, SCHUETTE, Michael L, LEE, Jaesun, WU LU, MABON, James C
Published in Journal of electronic materials (01.09.2007)
Published in Journal of electronic materials (01.09.2007)
Get full text
Journal Article
Reverse bias lifetime analysis of 600V enhancement mode GaN devices
Kannan, Hari, Veereddy, Deepak, Zhaofeng Wang, Khalil, Sameh, Charles, Alain, Hyeongnam Kim, Imam, Mohamed
Published in 2017 IEEE 5th Workshop on Wide Bandgap Power Devices and Applications (WiPDA) (01.10.2017)
Published in 2017 IEEE 5th Workshop on Wide Bandgap Power Devices and Applications (WiPDA) (01.10.2017)
Get full text
Conference Proceeding
Trap behavior in AlGaN/GaN HEMTs by post-gate-annealing
Hyeongnam Kim, Jaesun Lee, Wu Lu
Published in Proceedings. IEEE Lester Eastman Conference on High Performance Devices, 2004 (2004)
Published in Proceedings. IEEE Lester Eastman Conference on High Performance Devices, 2004 (2004)
Get full text
Conference Proceeding