Characterization of Channel-Diameter-Dependent Low-Frequency Noise in Silicon Nanowire Field-Effect Transistors
Sang-Hyun Lee, Chang-Ki Baek, Sooyoung Park, Dong-Won Kim, Dong Kyun Sohn, Jeong-Soo Lee, Kim, D. M., Yoon-Ha Jeong
Published in IEEE electron device letters (01.10.2012)
Published in IEEE electron device letters (01.10.2012)
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Journal Article
Three-Dimensional Simulation of Dopant-Fluctuation-Induced Threshold Voltage Dispersion in Nonplanar MOS Structures Targeting Flash EEPROM Transistors
KIM, Bomsoo, KWON, Wookhyun, BAEK, Chang-Ki, JIN, Seonghoon, SONG, Yunheub, KIM, Dae M
Published in IEEE transactions on electron devices (01.06.2008)
Published in IEEE transactions on electron devices (01.06.2008)
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Journal Article
C- V Characteristics in Undoped Gate-All-Around Nanowire FET Array
Rock-Hyun Baek, Chang-Ki Baek, Sang-Hyun Lee, Sung Dae Suk, Ming Li, Yun Young Yeoh, Kyoung Hwan Yeo, Dong-Won Kim, Jeong-Soo Lee, Kim, D M, Yoon-Ha Jeong
Published in IEEE electron device letters (01.02.2011)
Published in IEEE electron device letters (01.02.2011)
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Journal Article
Comparison of Series Resistance and Mobility Degradation Extracted from n- and p-Type Si-Nanowire Field Effect Transistors Using the $Y$-Function Technique
Baek, Rock-Hyun, Baek, Chang-Ki, Jung, Sung-Woo, Yeoh, Yun Young, Kim, Dong-Won, Lee, Jeong-Soo, Kim, Dae M, Jeong, Yoon-Ha
Published in Japanese Journal of Applied Physics (01.04.2010)
Published in Japanese Journal of Applied Physics (01.04.2010)
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Journal Article
Performance of single-electron transistor logic composed of multi-gate single-electron transistors
JEONG, M.-Y, JEONG, Y.-H, HWANG, S.-W, KIM, D. M
Published in Japanese Journal of Applied Physics (01.11.1997)
Published in Japanese Journal of Applied Physics (01.11.1997)
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Journal Article
Characterization and Modeling of 1/ f Noise in Si-nanowire FETs: Effects of Cylindrical Geometry and Different Processing of Oxides
Rock-Hyun Baek, Chang-Ki Baek, Hyun-Sik Choi, Jeong-Soo Lee, Yun Young Yeoh, Kyoung Hwan Yeo, Dong-Won Kim, Kinam Kim, Kim, D M, Yoon-Ha Jeong
Published in IEEE transactions on nanotechnology (01.05.2011)
Published in IEEE transactions on nanotechnology (01.05.2011)
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Journal Article
Characteristics of the Series Resistance Extracted From Si Nanowire FETs Using the Y -Function Technique
Rock-Hyun Baek, Chang-Ki Baek, Sung-Woo Jung, Yun Young Yeoh, Dong-Won Kim, Jeong-Soo Lee, Kim, D.M., Yoon-Ha Jeong
Published in IEEE transactions on nanotechnology (01.03.2010)
Published in IEEE transactions on nanotechnology (01.03.2010)
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Journal Article
Electrode-Molecule Interface Effects on Molecular Conductance
Tarakeshwar, P., Palacios, J.J., Kim, D.M.
Published in IEEE transactions on nanotechnology (01.01.2009)
Published in IEEE transactions on nanotechnology (01.01.2009)
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Journal Article
Modulation of Molecular Conductance Induced by Electrode Atomic Species and Interface Geometry
Tarakeshwar, P, Palacios, Juan Jose, Kim, Dae M
Published in The journal of physical chemistry. B (13.04.2006)
Published in The journal of physical chemistry. B (13.04.2006)
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Journal Article
Open versus laparoscopic surgery for mid-rectal or low-rectal cancer after neoadjuvant chemoradiotherapy (COREAN trial): survival outcomes of an open-label, non-inferiority, randomised controlled trial
Jeong, Seung-Yong, Prof, Park, Ji Won, MD, Nam, Byung Ho, Prof, Kim, Sohee, MS, Kang, Sung-Bum, MD, Lim, Seok-Byung, MD, Choi, Hyo Seong, MD, Kim, Duck-Woo, MD, Chang, Hee Jin, MD, Kim, Dae Yong, MD, Jung, Kyung Hae, Prof, Kim, Tae-You, Prof, Kang, Gyeong Hoon, Prof, Chie, Eui Kyu, MD, Kim, Sun Young, MD, Sohn, Dae Kyung, MD, Kim, Dae-Hyun, MD, Kim, Jae-Sung, Prof, Lee, Hye Seung, MD, Kim, Jee Hyun, MD, Oh, Jae Hwan, Prof
Published in The lancet oncology (01.06.2014)
Published in The lancet oncology (01.06.2014)
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Journal Article
Open versus laparoscopic surgery for mid or low rectal cancer after neoadjuvant chemoradiotherapy (COREAN trial): short-term outcomes of an open-label randomised controlled trial
Kang, Sung-Bum, MD, Park, Ji Won, MD, Jeong, Seung-Yong, MD, Nam, Byung Ho, PhD, Choi, Hyo Seong, MD, Kim, Duck-Woo, MD, Lim, Seok-Byung, MD, Lee, Taek-Gu, MD, Kim, Dae Yong, MD, Kim, Jae-Sung, Prof, Chang, Hee Jin, MD, Lee, Hye-Seung, MD, Kim, Sun Young, MD, Jung, Kyung Hae, MD, Hong, Yong Sang, MD, Kim, Jee Hyun, MD, Sohn, Dae Kyung, MD, Kim, Dae-Hyun, MD, Oh, Jae Hwan, Dr
Published in The lancet oncology (01.07.2010)
Published in The lancet oncology (01.07.2010)
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Journal Article
Characterization of Near-Interface Oxide Trap Density in Nitrided Oxides for Nanoscale MOSFET Applications
Younghwan Son, Chang-Ki Baek, In-Shik Han, Han-Soo Joo, Tae-Gyu Goo, Ooksang Yoo, Wonho Choi, Hee-Hwan Ji, Hi-Deok Lee, Kim, D.M.
Published in IEEE transactions on nanotechnology (01.09.2009)
Published in IEEE transactions on nanotechnology (01.09.2009)
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Journal Article
Reliable extraction of cycling induced interface states implementing realistic P/E stresses in reference cell: comparison with flash memory cell
Chang-Ki Baek, Bomsoo Kim, Son, Y., Wookhyun Kwon, Chan-Kwang Park, Park, Y.J., Hong Shick Min, Kim, D.M.
Published in IEEE electron device letters (01.03.2006)
Published in IEEE electron device letters (01.03.2006)
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Journal Article
Simple Experimental Determination of the Spread of Trapped Hot Holes Injected in Silicon-Oxide-Nitride-Oxide-Silicon (SONOS) Cells: Optimized Erase and Cell Shrinkage
Kim, Bomsoo, Baek, Chang-Ki, Kwon, Wookhyun, Jeong, Yoon-Ha, Kim, Dae M.
Published in Japanese Journal of Applied Physics (15.12.2004)
Published in Japanese Journal of Applied Physics (15.12.2004)
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Journal Article