Metallic Ti3C2Tx MXene Gas Sensors with Ultrahigh Signal-to-Noise Ratio
Kim, Seon Joon, Koh, Hyeong-Jun, Ren, Chang E, Kwon, Ohmin, Maleski, Kathleen, Cho, Soo-Yeon, Anasori, Babak, Kim, Choong-Ki, Choi, Yang-Kyu, Kim, Jihan, Gogotsi, Yury, Jung, Hee-Tae
Published in ACS nano (27.02.2018)
Published in ACS nano (27.02.2018)
Get full text
Journal Article
Investigation of Self-Heating Effects in Gate-All-Around MOSFETs With Vertically Stacked Multiple Silicon Nanowire Channels
Park, Jun-Young, Lee, Byung-Hyun, Chang, Ki Soo, Kim, Dong Uk, Jeong, Chanbae, Kim, Choong-Ki, Bae, Hagyoul, Choi, Yang-Kyu
Published in IEEE transactions on electron devices (01.11.2017)
Published in IEEE transactions on electron devices (01.11.2017)
Get full text
Journal Article
Electro-Thermal Annealing Method for Recovery of Cyclic Bending Stress in Flexible a-IGZO TFTs
Lee, Myung Keun, Kim, Choong-Ki, Park, Jeong Woo, Kim, Eungtaek, Seol, Myeong-Lok, Park, Jun-Young, Choi, Yang-Kyu, Park, Sang-Hee Ko, Choi, Kyung Cheol
Published in IEEE transactions on electron devices (01.08.2017)
Published in IEEE transactions on electron devices (01.08.2017)
Get full text
Journal Article
Oyster larval transport in coastal Alabama: Dominance of physical transport over biological behavior in a shallow estuary
Kim, Choong-Ki, Park, Kyeong, Powers, Sean P., Graham, William M., Bayha, Keith M.
Published in Journal of Geophysical Research: Oceans (01.10.2010)
Published in Journal of Geophysical Research: Oceans (01.10.2010)
Get full text
Journal Article
Self-Curable Gate-All-Around MOSFETs Using Electrical Annealing to Repair Degradation Induced From Hot-Carrier Injection
Park, Jun-Young, Moon, Dong-Il, Seol, Myeong-Lok, Kim, Choong-Ki, Jeon, Chang-Hoon, Bae, Hagyoul, Bang, Tewook, Choi, Yang-Kyu
Published in IEEE transactions on electron devices (01.03.2016)
Published in IEEE transactions on electron devices (01.03.2016)
Get full text
Journal Article
Low-Frequency Noise Characteristics in SONOS Flash Memory With Vertically Stacked Nanowire FETs
Bang, Tewook, Lee, Byung-Hyun, Kim, Choong-Ki, Ahn, Dae-Chul, Jeon, Seung-Bae, Kang, Min-Ho, Oh, Jae-Sub, Choi, Yang-Kyu
Published in IEEE electron device letters (01.01.2017)
Published in IEEE electron device letters (01.01.2017)
Get full text
Journal Article
A Novel Technique for Curing Hot-Carrier-Induced Damage by Utilizing the Forward Current of the PN-Junction in a MOSFET
Lee, Geon-Beom, Kim, Choong-Ki, Park, Jun-Young, Bang, Tewook, Bae, Hagyoul, Kim, Seong-Yeon, Ryu, Seung-Wan, Choi, Yang-Kyu
Published in IEEE electron device letters (01.08.2017)
Published in IEEE electron device letters (01.08.2017)
Get full text
Journal Article
Formation of Low-Resistivity Nickel Germanide Using Atomic Layer Deposited Nickel Thin Film
Ahn, Hyun Jun, Moon, Jungmin, Seo, Yujin, Lee, Tae In, Kim, Choong-Ki, Hwang, Wan Sik, Yu, Hyun-Yong, Cho, Byung Jin
Published in IEEE transactions on electron devices (01.06.2017)
Published in IEEE transactions on electron devices (01.06.2017)
Get full text
Journal Article
Synergistic protective effects of a statin and an angiotensin receptor blocker for initiation and progression of atherosclerosis
Lee, Seul-Gee, Lee, Seung-Jun, Thuy, Nguyen Viet Phuong, Kim, Jung-Sun, Lee, Jung-Jae, Lee, Oh-Hyun, Kim, Choong-Ki, Oh, Jaewon, Park, Seil, Lee, Ok-Hee, Kim, Se Hoon, Park, Sungha, Lee, Sang-Hak, Hong, Sung-Jin, Ahn, Chul-Min, Kim, Byeong-Keuk, Ko, Young-Guk, Choi, Donghoon, Hong, Myeong-Ki, Jang, Yangsoo
Published in PloS one (03.05.2019)
Published in PloS one (03.05.2019)
Get full text
Journal Article
Investigation of Low-Frequency Noise in Nonvolatile Memory Composed of a Gate- All-Around Junctionless Nanowire FET
Jeong, Ui-Sik, Kim, Choong-Ki, Bae, Hagyoul, Moon, Dong-Il, Bang, Tewook, Choi, Ji-Min, Hur, Jae, Choi, Yang-Kyu
Published in IEEE transactions on electron devices (01.05.2016)
Published in IEEE transactions on electron devices (01.05.2016)
Get full text
Journal Article
The Work Function Behavior of Aluminum-Doped Titanium Carbide Grown by Atomic Layer Deposition
Jungmin Moon, Hyun Jun Ahn, Yujin Seo, Tae In Lee, Choong-Ki Kim, Rho, Il Cheol, Choon Hwan Kim, Wan Sik Hwang, Byung Jin Cho
Published in IEEE transactions on electron devices (01.04.2016)
Published in IEEE transactions on electron devices (01.04.2016)
Get full text
Journal Article
Reply to Comments by Ortiz-Conde et al
Kim, Gun-Hee, Bae, Hagyoul, Hur, Jae, Kim, Choong-Ki, Lee, Geon-Bum, Bang, Tewook, Choi, Yang-Kyu
Published in IEEE transactions on electron devices (01.09.2018)
Published in IEEE transactions on electron devices (01.09.2018)
Get full text
Journal Article
Investigation of Border Trap Characteristics in the AlON/GeO2/Ge Gate Stacks
Yujin Seo, Choong-Ki Kim, Tae-In Lee, Wan Sik Hwang, Hyun-Yong Yu, Yang-Kyu Choi, Byung Jin Cho
Published in IEEE transactions on electron devices (01.10.2017)
Published in IEEE transactions on electron devices (01.10.2017)
Get full text
Journal Article