Low copy number DNA profiling from isolated sperm using the aureka® -micromanipulation system
Schneider, C, Müller, U, Kilper, R, Siebertz, B
Published in Forensic science international : genetics (01.07.2012)
Published in Forensic science international : genetics (01.07.2012)
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Journal Article
A comparative study of elastic recoil detection analysis (ERDA), electron energy loss spectroscopy (EELS) and X-ray photoelectron spectroscopy (XPS) for structural analysis of amorphous carbon nitride films
Spaeth, C., Kühn, M., Richter, F., Falke, U., Hietschold, M., Kilper, R., Kreissig, U.
Published in Diamond and related materials (01.12.1998)
Published in Diamond and related materials (01.12.1998)
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Journal Article
Interface reactions in [Fe/B]n multilayers: a way to tune from crystalline/amorphous layer sequences to homogeneous amorphous FexB100-x films
Steiner, R, Boyen, H-G, Krieger, M, Plettl, A, Widmayer, P, Ziemann, P, Banhart, F, Kilper, R, Oelhafen, P
Published in Applied physics. A, Materials science & processing (01.01.2003)
Published in Applied physics. A, Materials science & processing (01.01.2003)
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Journal Article
Preparation and properties of thin polycrystalline MnSi1.73 films
Teichert, St, Kilper, R., Erben, J., Franke, D., Gebhard, B., Franke, Th, Häussler, P., Henrion, W., Lange, H.
Published in Applied surface science (01.09.1996)
Published in Applied surface science (01.09.1996)
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Journal Article
Electrical and optical properties of thin Fe1-xCoxSi2 films
TEICHERT, S, KILPER, R, FRANKE, T, ERBEN, J, HÄUSSLER, P, HENRION, W, LANGE, H, PANKNIN, D
Published in Applied surface science (01.10.1995)
Published in Applied surface science (01.10.1995)
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Conference Proceeding
Journal Article
Photoelectron spectroscopic investigations of thin FexSi100-x films
KILPER, R, TEICHERT, S, FRANKE, T, HÄUSSLER, P, BOYEN, H.-G, COSSY-FAVRE, A, OELHAFEN, P
Published in Applied surface science (01.10.1995)
Published in Applied surface science (01.10.1995)
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Conference Proceeding
Journal Article
Interface reactions in [Fe/B] n multilayers: a way to tune from crystalline/amorphous layer sequences to homogeneous amorphous Fe x B 100-x films
Steiner, R., Boyen, H.-G., Krieger, M., Plettl, A., Widmayer, P., Ziemann, P., Banhart, F., Kilper, R., Oelhafen, P.
Published in Applied physics. A, Materials science & processing (01.01.2003)
Published in Applied physics. A, Materials science & processing (01.01.2003)
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Journal Article
Preparation and properties of thin polycrystalline MnSi 1.73 films
Teichert, St, Kilper, R., Erben, J., Franke, D., Gebhard, B., Franke, Th, Häussler, P., Henrion, W., Lange, H.
Published in Applied surface science (1996)
Published in Applied surface science (1996)
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Journal Article
Electrical and optical properties of thin Fe sub 1-x Co sub x Si sub 2 films
Teichert, S, Kilper, R, Franke, T, Erben, J, Haussler, P, Henrion, W, Lange, H, Panknin, D
Published in Applied surface science (16.10.1995)
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Published in Applied surface science (16.10.1995)
Journal Article
Photoelectron spectroscopic investigations of thin Fe xSi 100− x films
Kilper, R., Teichert, St, Franke, Th, Häussler, P., Boyen, H.-G., Cossy-Favre, A., Oelhafen, P.
Published in Applied surface science (1995)
Published in Applied surface science (1995)
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Journal Article
Electrical and optical properties of thin Fe 1− xCo xSi 2 films
Teichert, S., Kilper, R., Franke, T., Erben, J., Häussler, P., Henrion, W., Lange, H., Panknin, D.
Published in Applied surface science (1995)
Published in Applied surface science (1995)
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Journal Article
Photoelectron spectroscopic investigations of thin Fe sub x Si sub 100-x films
Kilper, R, Teichert, S T, Franke, T H, Haussler, P, Boyen, H-G, Cossy-Favre, A, Oelhafen, P
Published in Applied surface science (16.10.1995)
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Published in Applied surface science (16.10.1995)
Journal Article
Preparation and properties of thin polycrystalline MnSi1.73films
TEICHERT, S, KILPER, R, ERBEN, J, FRANKE, D, GEBHARD, B, FRANKE, T, HÄUSSLER, P, HENRION, W, LANGE, H
Published in Applied surface science (1996)
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Published in Applied surface science (1996)
Conference Proceeding
Developmental toxicology investigation of tellurium
Johnson, E.M., Christian, M.S., Hoberman, A.M., DeMarco, C.J., Kilpper, R., Mermelstein, R.
Published in Fundamental and applied toxicology (01.11.1988)
Published in Fundamental and applied toxicology (01.11.1988)
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Journal Article