Hot-Electron-Related Degradation in InAlN/GaN High-Electron-Mobility Transistors
Tapajna, Milan, Killat, Nicole, Palankovski, Vassil, Gregusova, Dagmar, Cico, Karol, Carlin, Jean-Francois, Grandjean, Nicolas, Kuball, Martin, Kuzmik, Jan
Published in IEEE transactions on electron devices (01.08.2014)
Published in IEEE transactions on electron devices (01.08.2014)
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Journal Article
Thermal properties of AlGaN/GaN high electron mobility transistors on 4H and 6H SiC substrates: Thermal properties of AlGaN/GaN high electron mobility transistors
Killat, Nicole, Pomeroy, James W., Jimenez, Jose L., Kuball, Martin
Published in Physica status solidi. A, Applications and materials science (01.12.2014)
Published in Physica status solidi. A, Applications and materials science (01.12.2014)
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Journal Article
The role of surface barrier oxidation on AIGaN/GaN HEMTs reliability
TAPAJNA, Milan, KILLAT, Nicole, CHOWDHURY, Uttiya, JIMENEZ, Jose L, KUBALL, Martin
Published in Microelectronics and reliability (2012)
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Published in Microelectronics and reliability (2012)
Conference Proceeding
Reliability of GaN HEMTs: Thermal and Electrical Challenges
Kuball, Martin, Pomeroy, James W., Tapajna, Milan, Killat, Nicole, Manoi, Athikom, Uren, Michael J., Faqir, Mustapha
Published in Meeting abstracts (Electrochemical Society) (01.08.2011)
Published in Meeting abstracts (Electrochemical Society) (01.08.2011)
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Journal Article