Electrical properties and radiation hardness of SOI systems with multilayer buried dielectric
Barchuk, I.P., Kilchitskaya, V.I., Lysenko, V.S., Nazarov, A.N., Rudenko, T.E., Djurenko, S.V., Rudenko, A.N., Yurchenko, A.P., Ballutaud, D.B., Colinge, J.-P.
Published in IEEE transactions on nuclear science (01.12.1997)
Published in IEEE transactions on nuclear science (01.12.1997)
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Journal Article
Diffusion model for high-temperature off-state currents in SOI MOSFETs
Rudenko, T.E., Kilchitskaya, V.I., Rudenko, A.N.
Published in Microelectronic engineering (01.06.1997)
Published in Microelectronic engineering (01.06.1997)
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Journal Article