Layer resolved structural relaxation at the surface of magnetic FePt icosahedral nanoparticles
Wang, R M, Dmitrieva, O, Farle, M, Dumpich, G, Ye, H Q, Poppa, H, Kilaas, R, Kisielowski, C
Published in Physical review letters (11.01.2008)
Published in Physical review letters (11.01.2008)
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Journal Article
3-D reconstruction of the atomic positions in a simulated gold nanocrystal based on discrete tomography: Prospects of atomic resolution electron tomography
Jinschek, J.R., Batenburg, K.J., Calderon, H.A., Kilaas, R., Radmilovic, V., Kisielowski, C.
Published in Ultramicroscopy (01.05.2008)
Published in Ultramicroscopy (01.05.2008)
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Journal Article
Surface Reconstruction with a Fractional Hole: (sqrt[5] x sqrt[5])R26.6 degrees LaAlO3 (001)
Lanier, C H, Rondinelli, J M, Deng, B, Kilaas, R, Poeppelmeier, K R, Marks, L D
Published in Physical review letters (23.02.2007)
Published in Physical review letters (23.02.2007)
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Journal Article
Nickel accumulation and nickel oxalate precipitation by Aspergillus niger
Magyarosy, A, Laidlaw, R.D, Kilaas, R, Echer, C, Clark, D.S, Keasling, J.D
Published in Applied microbiology and biotechnology (01.07.2002)
Published in Applied microbiology and biotechnology (01.07.2002)
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Journal Article
Structure and morphology of S-phase precipitates in aluminum
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Journal Article
Conference Proceeding
Imaging columns of the light elements carbon, nitrogen and oxygen with sub Ångstrom resolution
Kisielowski, C., Hetherington, C.J.D., Wang, Y.C., Kilaas, R., O’Keefe, M.A., Thust, A.
Published in Ultramicroscopy (01.11.2001)
Published in Ultramicroscopy (01.11.2001)
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Journal Article
Determination of the atomic structure of a Σ13 SrTiO3 grain boundary
Ayache, J., Kisielowski, C., Kilaas, R., Passerieux, G., Lartigue-Korinek, S.
Published in Journal of materials science (01.06.2005)
Published in Journal of materials science (01.06.2005)
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Journal Article
Application of Aberration-Corrected TEM and Image Simulation to Nanoelectronics and Nanotechnology
Korgel, B.A., Lee, D.C., Hanrath, T., Yacaman, M.J., Thesen, A., Matijevic, M., Kilaas, R., Kisielowski, C., Diebold, A.C.
Published in IEEE transactions on semiconductor manufacturing (01.11.2006)
Published in IEEE transactions on semiconductor manufacturing (01.11.2006)
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Conference Proceeding
Quantitative analysis of strain field in thin films from HRTEM micrographs
Snoeck, E, Warot, B, Ardhuin, H, Rocher, A, Casanove, M.J, Kilaas, R, Hÿtch, M.J
Published in Thin solid films (29.04.1998)
Published in Thin solid films (29.04.1998)
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Journal Article
Conference Proceeding
Atomic Resolution Electron Tomography Based on Discrete Mathematics
Jinschek, JR, Batenburg, KJ, Calderon, HA, Kilaas, R, Radmilovic, V, Kisielowski, C
Published in Microscopy and microanalysis (01.08.2006)
Published in Microscopy and microanalysis (01.08.2006)
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Journal Article
An Interpretable Joint Nonnegative Matrix Factorization-Based Point Cloud Distance Measure
Friedman, Hannah, Maina-Kilaas, Amani R., Schalkwyk, Julianna, Ahmed, Hina, Haddock, Jamie
Published in 2023 57th Annual Conference on Information Sciences and Systems (CISS) (22.03.2023)
Published in 2023 57th Annual Conference on Information Sciences and Systems (CISS) (22.03.2023)
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Conference Proceeding
The Hero's Dilemma: Survival Advantages of Intention Perception in Virtual Agent Games
Maina-Kilaas, Amani R., Montanez, George D., Hom, Cynthia, Ginta, Kevin, Lay, Cindy
Published in 2021 IEEE Conference on Games (CoG) (17.08.2021)
Published in 2021 IEEE Conference on Games (CoG) (17.08.2021)
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Conference Proceeding