In-Depth Analysis of NBTI at 2X nm Node DRAM
Seunguk Han, Sungsam Lee, Sungkweon Baek, Sungho Jang, Wonchang Jeong, Kijae Huh, Moonyoung Jeong, Junhee Lim, Yamada, Satoru, Hyeongsun Hong, Kyupil Lee, Gyoyoung Jin, Eunseung Jung
Published in 2016 IEEE 8th International Memory Workshop (IMW) (01.05.2016)
Published in 2016 IEEE 8th International Memory Workshop (IMW) (01.05.2016)
Get full text
Conference Proceeding
The Observation of Gate Length Dependence of GIDL in n-MOSFET's
Son, Jeonghwan, Huh, Kijae, Lee, Sangdon, Hwang, Jeongmo
Published in ESSDERC '96: Proceedings of the 26th European Solid State Device Research Conference (01.09.1996)
Get full text
Published in ESSDERC '96: Proceedings of the 26th European Solid State Device Research Conference (01.09.1996)
Conference Proceeding
New anti-punchthrough design for buried channel PMOSFET
Son, J., Lee, S., Huh, K., Yang, W., Lee, Y., Hwang, J.
Published in 27th European Solid-State Device Research Conference (1997)
Published in 27th European Solid-State Device Research Conference (1997)
Get full text
Conference Proceeding
The Degradation of MOS Devices by Source/Drain Ion Impantation
Sangdon Lee, Jeonghwan Son, Jaeseog Yoon, Kijae Huh, Dooyoung Yang
Published in Proceedings of 1st International Symposium on Plasma Process-Induced Damage (1996)
Published in Proceedings of 1st International Symposium on Plasma Process-Induced Damage (1996)
Get full text
Conference Proceeding
Comparative study of several anti-punchthrough designs for buried channel PMOSFET
Jeonghwan Son, Seungho Lee, Kijae Huh, Wouns Yang, Youngjong Lee, Jeongmo Hwang
Published in 1997 55th Annual Device Research Conference Digest (1997)
Published in 1997 55th Annual Device Research Conference Digest (1997)
Get full text
Conference Proceeding