Quantitative measurement of contact area and electron transport across platinum nanocontacts for scanning probe microscopy and electrical nanodevices
Vishnubhotla, Sai Bharadwaj, Chen, Rimei, Khanal, Subarna R, Li, Jing, Stach, Eric A, Martini, Ashlie, Jacobs, Tevis D B
Published in Nanotechnology (27.11.2019)
Published in Nanotechnology (27.11.2019)
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Journal Article
Sub-10 Nanometer Feature Size in Silicon Using Thermal Scanning Probe Lithography
Ryu Cho, Yu Kyoung, Rawlings, Colin D, Wolf, Heiko, Spieser, Martin, Bisig, Samuel, Reidt, Steffen, Sousa, Marilyne, Khanal, Subarna R, Jacobs, Tevis D. B, Knoll, Armin W
Published in ACS nano (26.12.2017)
Published in ACS nano (26.12.2017)
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Journal Article
Effect of silicon and oxygen dopants on the stability of hydrogenated amorphous carbon under harsh environmental conditions
Mangolini, Filippo, Krick, Brandon A., Jacobs, Tevis D.B., Khanal, Subarna R., Streller, Frank, McClimon, J. Brandon, Hilbert, James, Prasad, Somuri V., Scharf, Thomas W., Ohlhausen, James A., Lukes, Jennifer R., Sawyer, W. Gregory, Carpick, Robert W.
Published in Carbon (New York) (01.04.2018)
Published in Carbon (New York) (01.04.2018)
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Journal Article
Correction to: Matching Atomistic Simulations and In Situ Experiments to Investigate the Mechanics of Nanoscale Contact
Vishnubhotla, Sai Bharadwaj, Chen, Rimei, Khanal, Subarna R., Hu, Xiaoli, Martini, Ashlie, Jacobs, Tevis D. B.
Published in Tribology letters (01.03.2020)
Published in Tribology letters (01.03.2020)
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Journal Article
A simple atomic force microscope-based method for quantifying wear of sliding probes
Flater, Erin E, Barnes, Jared D, Hitz Graff, Jesse A, Weaver, Jayse M, Ansari, Naveed, Poda, Aimee R, Robert Ashurst, W, Khanal, Subarna R, Jacobs, Tevis D B
Published in Review of scientific instruments (01.11.2018)
Published in Review of scientific instruments (01.11.2018)
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Journal Article
Characterization of small-scale surface topography using transmission electron microscopy
Khanal, Subarna R, Gujrati, Abhijeet, Vishnubhotla, Sai Bharadwaj, Nowakowski, Pawel, Bonifacio, Cecile S, Pastewka, Lars, Jacobs, Tevis D B
Published in Surface topography metrology and properties (24.10.2018)
Published in Surface topography metrology and properties (24.10.2018)
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Journal Article
Comprehensive topography characterization of polycrystalline diamond coatings
Gujrati, Abhijeet, Sanner, Antoine, Khanal, Subarna R., Moldovan, Nicolaie, Zeng, Hongjun, Pastewka, Lars, Jacobs, Tevis D. B.
Published in Surface topography metrology and properties (01.03.2021)
Published in Surface topography metrology and properties (01.03.2021)
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Journal Article
In situ Mechanical Testing of Contacts Between Nanoscale Bodies: Measuring the Load-dependence of Contact Area
Bharadwaj Vishnubhotla, Sai, Chen, Rimei, Khanal, Subarna R., Hu, Xiaoli, Martini, Ashlie, Jacobs, Tevis D. B.
Published in Microscopy and microanalysis (01.07.2017)
Published in Microscopy and microanalysis (01.07.2017)
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Journal Article
Effect of silicon and oxygen dopants on the stability of hydrogenated amorphous carbon under harsh environmental conditions
Mangolini, Filippo, Krick, Brandon A., Jacobs, Tevis D. B., Khanal, Subarna R., Streller, Frank, McClimon, J. Brandon, Hilbert, James, Prasad, Somuri V., Scharf, Thomas W., Ohlhausen, James A., Lukes, Jennifer R., Sawyer, W. Gregory, Carpick, Robert W.
Published in Carbon (New York) (27.12.2017)
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Published in Carbon (New York) (27.12.2017)
Journal Article
Comprehensive topography characterization of polycrystalline diamond coatings
Gujrati, Abhijeet, Sanner, Antoine, Khanal, Subarna R, Moldovan, Nicolaie, Zeng, Hongjun, Pastewka, Lars, Jacobs, Tevis D B
Published in arXiv.org (18.03.2021)
Published in arXiv.org (18.03.2021)
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Paper
Journal Article
Linking energy loss in soft adhesion to surface roughness
Dalvi, Siddhesh, Gujrati, Abhijeet, Khanal, Subarna R, Pastewka, Lars, Dhinojwala, Ali, Jacobs, Tevis D B
Published in arXiv.org (02.12.2019)
Published in arXiv.org (02.12.2019)
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Paper
Journal Article
A method for quantitative real-time evaluation of measurement reliability when using atomic force microscopy-based metrology
Gujrati, Abhijeet, Khanal, Subama R., Jacobs, Tevis D. B.
Published in 2017 IEEE 17th International Conference on Nanotechnology (IEEE-NANO) (01.07.2017)
Published in 2017 IEEE 17th International Conference on Nanotechnology (IEEE-NANO) (01.07.2017)
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Conference Proceeding
Investigating load-dependent conduction through platinum nanocontacts using in situ electromechanical testing inside a transmission electron microscope
Vishnubhotla, Sai Bharadwaj, Khanal, Subarna R., Jing Li, Stach, Eric A., Jacobs, Tevis D. B.
Published in 2017 IEEE 17th International Conference on Nanotechnology (IEEE-NANO) (01.07.2017)
Published in 2017 IEEE 17th International Conference on Nanotechnology (IEEE-NANO) (01.07.2017)
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Conference Proceeding