A new dynamic beta-ratio circuit technique for strained-Si technology
Get full text
Conference Proceeding
Analysis and modeling methodology of strained-Si channel-on-insulator (SSOI) MOSFETs
Keunwoo Kim, Ching-Te Chuang, Rim, K., Jin Cai, Haensch, W.E.
Published in 2003 International Symposium on VLSI Technology, Systems and Applications. Proceedings of Technical Papers. (IEEE Cat. No.03TH8672) (2003)
Published in 2003 International Symposium on VLSI Technology, Systems and Applications. Proceedings of Technical Papers. (IEEE Cat. No.03TH8672) (2003)
Get full text
Conference Proceeding
Asymmetrical SRAM Cells with Enhanced Read and Write Margins
Keunwoo Kim, Jae-Joon Kim, Ching-Te Chuang
Published in 2007 International Symposium on VLSI Technology, Systems and Applications (VLSI-TSA) (01.04.2007)
Published in 2007 International Symposium on VLSI Technology, Systems and Applications (VLSI-TSA) (01.04.2007)
Get full text
Conference Proceeding
A high-density SRAM design technique using silicon nanowire FETs
Yi-Bo Liao, Meng-Hsueh Chiang, Keunwoo Kim, Wei-Chou Hsu
Published in 2011 International Semiconductor Device Research Symposium (ISDRS) (01.12.2011)
Published in 2011 International Semiconductor Device Research Symposium (ISDRS) (01.12.2011)
Get full text
Conference Proceeding