Impact of Collector-Base Space Charge Region on RF Noise in Bipolar Transistors
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Dual-Gate JFET Modeling II: Source Pinchoff Voltage and Complete I} Modeling Formalism
Kejun Xia, McAndrew, Colin C., Grote, Bernhard
Published in IEEE transactions on electron devices (01.04.2016)
Published in IEEE transactions on electron devices (01.04.2016)
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Journal Article
JFETIDG: A compact model for independent dual-gate JFETs
Kejun Xia, McAndrew, Colin C., Hanyu Sheng
Published in 2017 IEEE Electron Devices Technology and Manufacturing Conference (EDTM) (01.02.2017)
Published in 2017 IEEE Electron Devices Technology and Manufacturing Conference (EDTM) (01.02.2017)
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Conference Proceeding
Input non-quasi-static effect in SiGe HBTs and its impact on noise modeling
Kejun Xia, Guofu Niu, Sheridan, D., Sweeney, S.
Published in Proceedings of the Bipolar/BiCMOS Circuits and Technology Meeting, 2005 (2005)
Published in Proceedings of the Bipolar/BiCMOS Circuits and Technology Meeting, 2005 (2005)
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Conference Proceeding
PSPHV: A Surface-Potential-Based Model for LDMOS Transistors
Xia, Kejun, McAndrew, Colin C., Van Langevelde, Ronald, Smit, Geert D. J., Scholten, Andries J.
Published in IEEE transactions on electron devices (01.12.2019)
Published in IEEE transactions on electron devices (01.12.2019)
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A Step-by-Step Layout Transformation Approach to Differentiate How Multiple Layout Dependent Effects Modify Device and Circuit Performance
Lu, Luke, Xia, Kejun, van Langevelde, Ronald, McAndrew, Colin C., Li, Wuxia
Published in 2024 IEEE 36th International Conference on Microelectronic Test Structures (ICMTS) (15.04.2024)
Published in 2024 IEEE 36th International Conference on Microelectronic Test Structures (ICMTS) (15.04.2024)
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Conference Proceeding
Characterization and Modeling of Zener Diode Breakdown Voltage Mismatch
Yang, Man, McAndrew, Colin C., Chao, Lei, Xia, Kejun
Published in 2019 IEEE 32nd International Conference on Microelectronic Test Structures (ICMTS) (01.03.2019)
Published in 2019 IEEE 32nd International Conference on Microelectronic Test Structures (ICMTS) (01.03.2019)
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Conference Proceeding
Foreword Special Issue on Compact Modeling for Circuit Design
Iniguez, Benjamin, Grabinski, Wladek, MijalkoviC, Slobodan, Xia, Kejun, Scholten, Andries J., Chauhan, Yogesh Singh, Roy, Ananda S., Yoshitomi, Sadayuki, Xu, Kaikai
Published in IEEE transactions on electron devices (01.01.2019)
Published in IEEE transactions on electron devices (01.01.2019)
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Journal Article
Accurate Gate Charge Modeling of HV LDMOS Transistors for Power Circuit Applications
Jie, Xiaorui, Langevelde, Ronald van, Xia, Kejun, Chao, Lei, McAndrew, Colin C., Zhang, Qilin, Bacchi, Matthew, Li, Wuxia
Published in 2023 35th International Conference on Microelectronic Test Structure (ICMTS) (27.03.2023)
Published in 2023 35th International Conference on Microelectronic Test Structure (ICMTS) (27.03.2023)
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Conference Proceeding
Layout Guidelines against Charging Damage from the Well-Side Antennas in Separated Power Domains
Kuo, Hsi-Yu, Chu, Yu-Lin, Dai, Hung-Da, Wang, Chun-Chi, Lin, Pei-Jung, Kuo, Shu-Cheng, Guo, Ethan, Zhang, Ya-Min, Su, Yu-Ti, Hsu, Chia-Lin, Chen, Kuan-Hung, Chen, Tsung-Yuan, Li, Te-Liang, Huang, Ray, Chen, Kuo-Ji, Song, Ming-Hsiang, Lu, Ryan, Xia, Kejun
Published in 2024 IEEE International Reliability Physics Symposium (IRPS) (14.04.2024)
Published in 2024 IEEE International Reliability Physics Symposium (IRPS) (14.04.2024)
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Conference Proceeding
Protection Schemes for Plasma Induced Damage from Well-Side Antennas
Kuo, Hsi-Yu, Chu, Yu-Lin, Dai, Hung-Da, Wang, Chun-Chi, Lin, Pei-Jung, Guo, Ethan, Su, Yu-Ti, Hsu, Chia-Lin, Chen, Kuan-Hung, Chen, Tsung-Yuan, Lu, Ryan, Liang, Victor, Chen, Kuo-Ji, Xia, Kejun
Published in 2023 IEEE International Reliability Physics Symposium (IRPS) (01.03.2023)
Published in 2023 IEEE International Reliability Physics Symposium (IRPS) (01.03.2023)
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Conference Proceeding
Physics and implications of minority carrier injection induced dopant deionization in bipolar transistor
Niu, Guofu, Li, Zhen, Luo, Lan, Wang, Jingshan, Xia, Kejun
Published in 2011 IEEE Bipolar/BiCMOS Circuits and Technology Meeting (01.10.2011)
Published in 2011 IEEE Bipolar/BiCMOS Circuits and Technology Meeting (01.10.2011)
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