18nm FDSOI Enhanced Device Platform for ULP/ULL MCUs
Weber, Olivier, Min, Doohong, Villaret, Alexandre, Park, Jinha, Lee, Ilmin, Vandenbossche, Eric, Kim, Dohun, Yun, Jiyoung, Park, Jinwoo, Lee, Minuk, Kang, Jinseok, Lee, Hyunjong, Choi, Youngju, Kim, Inhwan, Kim, Joochan, Kedar, Dhori, Janardan, Dhori Kedar, Haendler, Sebastien, Elghouli, Salim, Puget, Sophie, Bernicot, Christophe, Bernard, Emilie, Wacquant, Francois, Nimsgern, Fabien, Choi, Joonhyuk, Maeda, Shigenobu, Lee, Jongho, Arnaud, Franck
Published in 2022 International Electron Devices Meeting (IEDM) (03.12.2022)
Published in 2022 International Electron Devices Meeting (IEDM) (03.12.2022)
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Conference Proceeding
Write Assist Circuit to Cater Reliability and Floating Bit Line Problem of Negative Bit Line Assist Technique for Single or Multiport Static Random Access Memory
Dhori, Kedar Janardan, Kumar, Vinay, Rawat, Harsh
Published in IEEE transactions on very large scale integration (VLSI) systems (01.11.2014)
Published in IEEE transactions on very large scale integration (VLSI) systems (01.11.2014)
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Journal Article
3-Stage Pipelined Hierarchical SRAMs with Burst Mode Read in 65nm LSTP CMOS
Srivastav, Mukesh Kumar, Rimjhim, Mishra, Roshan, Grover, Anuj, Dhori, Kedar Janardan, Rawat, Harsh
Published in 2022 IEEE International Symposium on Circuits and Systems (ISCAS) (28.05.2022)
Published in 2022 IEEE International Symposium on Circuits and Systems (ISCAS) (28.05.2022)
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Conference Proceeding
Retention Problem Free High Density 4T SRAM cell with Adaptive Body Bias in 18nm FD-SOI
Kumar, Chandan, Kumar, Rahul, Grove, Anuj, Chatterjee, Shouri, Dhori, Kedar Janardan, Rawat, Harsh
Published in 2022 35th International Conference on VLSI Design and 2022 21st International Conference on Embedded Systems (VLSID) (01.02.2022)
Published in 2022 35th International Conference on VLSI Design and 2022 21st International Conference on Embedded Systems (VLSID) (01.02.2022)
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Conference Proceeding
40nm Ultra-low Leakage SRAM with Embedded Sub-threshold Analog Closed Loop System for Efficient Source Biasing of the Memory Array in Retention Mode
Dhori, Kedar Janardan, Kumar, Promod, Lecocq, Christophe, Urard, Pascal, Callen, Olivier, Cacho, Florian, Parra, Maryline, Pandey, Prashant, Noblet, Daniel
Published in 2022 35th International Conference on VLSI Design and 2022 21st International Conference on Embedded Systems (VLSID) (01.02.2022)
Published in 2022 35th International Conference on VLSI Design and 2022 21st International Conference on Embedded Systems (VLSID) (01.02.2022)
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Conference Proceeding
Circuit Monitoring Across Design Life-Cycle in 28nm FD-SOI and 40nm Bulk CMOS technologies
Clerc, Sylvain, Dhori, Kedar Janardan, Wilson, Robin M., Goel, Rohit, Marchal, Sebastien, Pourchon, Franck, Dutto, Christian, Gomez, Ricardo Gomez
Published in ESSCIRC 2021 - IEEE 47th European Solid State Circuits Conference (ESSCIRC) (13.09.2021)
Published in ESSCIRC 2021 - IEEE 47th European Solid State Circuits Conference (ESSCIRC) (13.09.2021)
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Conference Proceeding
A CMOS 90nm 50Mhz Supply Noise Tolerant High Density 8T-NAND ROM
Dhori, Kedar Janardan, Kumar, Vinay, Kumar, Ashish
Published in 2015 28th International Conference on VLSI Design (01.01.2015)
Published in 2015 28th International Conference on VLSI Design (01.01.2015)
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Conference Proceeding
High-yield design of high-density SRAM for low-voltage and low-leakage operations
Dhori, Kedar Janardan, Chawla, Hitesh, Kumar, Ashish, Pandey, Prashant, Kumar, Promod, Ciampolini, Lorenzo, Cacho, Florian, Croain, Damien
Published in 2017 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT) (01.10.2017)
Published in 2017 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT) (01.10.2017)
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Conference Proceeding
A 6T-SRAM in 28nm FDSOI technology with Vmin of 0.52V using assisted read and write operation
Kumar, Ashish, Kumar, Vinay, Janardan, Dhori Kedar, Visweswaran, G. S., Saha, Kaushik
Published in 2015 International Conference on IC Design & Technology (ICICDT) (01.06.2015)
Published in 2015 International Conference on IC Design & Technology (ICICDT) (01.06.2015)
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Conference Proceeding
Diagnostic Circuit for Latent Fault Detection in SRAM Row Decoder
Singh, Shivendra, Gupta, Varshita, Grover, Anuj, Dhori, Kedar Janardhan
Published in 2020 21st International Symposium on Quality Electronic Design (ISQED) (01.03.2020)
Published in 2020 21st International Symposium on Quality Electronic Design (ISQED) (01.03.2020)
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Conference Proceeding
Charge Scavenging Gate Coupled Hierarchical Bitline Scheme for Ultra-Low Power SRAMs in 65nm LSTP CMOS
Srivastav, Mukesh Kumar, Rimjhim, Soni, Govind, Mittal, Umang, Tewari, Rupali, Yadav, Riya, Grover, Anuj, Dhori, Kedar Janardan, Rawat, Harsh
Published in 2021 28th IEEE International Conference on Electronics, Circuits, and Systems (ICECS) (28.11.2021)
Published in 2021 28th IEEE International Conference on Electronics, Circuits, and Systems (ICECS) (28.11.2021)
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Conference Proceeding
Serial word line actuation with linked source voltage supply modulation for an in-memory compute operation where simultaneous access is made to plural rows of a static random access memory (SRAM)
Chawla, Nitin, Rawat, Harsh, Dhori, Kedar Janardan, Ayodhyawasi, Manuj, Kumar, Promod
Year of Publication 10.09.2024
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Year of Publication 10.09.2024
Patent