Crystalline Volume Fraction Effect on the Electronic Properties of Hydrogenated Microcrystalline Silicon μc-Si:H Investigated by Ellipsometry and AMPS-1D Simulation
Benhabara, H, Sib, J D, Bouhekka, A, Chahi, M, Benlakhel, D, Kebbab, A, Bouizem, Y, Chahed, L
Published in Journal of Nano- and Electronic Physics (01.01.2019)
Published in Journal of Nano- and Electronic Physics (01.01.2019)
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