Measurements of generation-recombination effect by low-frequency phase-noise technique in AlGaN/GaN MOSHFETs
Kayis, Cemil, Leach, Jacob H., Zhu, C.Y., Wu, Mo, Li, X., Özgür, Ümit, Morkoç, Hadis, Yang, X., Misra, Veena, Handel, Peter H.
Published in Physica status solidi. C (01.05.2011)
Published in Physica status solidi. C (01.05.2011)
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Journal Article
Low-Frequency Noise Measurements of AlGaN/GaN Metal-Oxide-Semiconductor Heterostructure Field-Effect Transistors With HfAlO Gate Dielectric
Kayis, C, Leach, J H, Zhu, C Y, Wu, M, Li, X, Özgür, Ümit, Morkoç, H, Yang, X, Misra, V, Handel, P H
Published in IEEE electron device letters (01.09.2010)
Published in IEEE electron device letters (01.09.2010)
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Journal Article
Reduction of Flicker Noise in AlGaN/GaN-Based HFETs After High Electric-Field Stress
Congyong Zhu, Kayis, C., Mo Wu, Xing Li, Fan Zhang, Avrutin, V., Ozgur, Umit, Morkoc, H.
Published in IEEE electron device letters (01.11.2011)
Published in IEEE electron device letters (01.11.2011)
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Journal Article