Optimal Selective Huffman Coding for Test-Data Compression
Kavousianos, X., Kalligeros, E., Nikolos, D.
Published in IEEE transactions on computers (01.08.2007)
Published in IEEE transactions on computers (01.08.2007)
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Journal Article
A Robust and Reconfigurable Multi-mode Power Gating Architecture
Zhang, Z, Kavousianos, X, Chakrabarty, K, Tsiatouhas, Y
Published in 2011 24th Internatioal Conference on VLSI Design (01.01.2011)
Published in 2011 24th Internatioal Conference on VLSI Design (01.01.2011)
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Conference Proceeding
Defect aware X-filling for low-power scan testing
Balatsouka, S, Tenentes, V, Kavousianos, X, Chakrabarty, K
Published in 2010 Design, Automation & Test in Europe Conference & Exhibition (DATE 2010) (01.03.2010)
Published in 2010 Design, Automation & Test in Europe Conference & Exhibition (DATE 2010) (01.03.2010)
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Conference Proceeding
Self-Freeze Linear Decompressors for Low Power Testing
Tenentes, V, Kavousianos, X
Published in 2010 IEEE Computer Society Annual Symposium on VLSI (01.07.2010)
Published in 2010 IEEE Computer Society Annual Symposium on VLSI (01.07.2010)
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Conference Proceeding
New efficient totally self-checking Berger code checkers
Kavousianos, X., Nikolos, D., Foukarakis, G., Gnardellis, T.
Published in Integration (Amsterdam) (01.09.1999)
Published in Integration (Amsterdam) (01.09.1999)
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Journal Article
Low Power Built-In Self-Test Schemes for Array and Booth Multipliers
Bakalist, D., Kavousianos, X., Vergos, H. T., Nikolos, D., Alexiou, G. Ph
Published in VLSI Design (01.01.2001)
Published in VLSI Design (01.01.2001)
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Journal Article
Signature Analysis for Testing, Diagnosis, and Repair of Multi-mode Power Switches
Zhaobo Zhang, Kavousianos, X., Yan Luo, Tsiatouhas, Y., Chakrabarty, K.
Published in 2011 Sixteenth IEEE European Test Symposium (01.05.2011)
Published in 2011 Sixteenth IEEE European Test Symposium (01.05.2011)
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Conference Proceeding
Low Power Test-Compression for High Test-Quality and Low Test-Data Volume
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Conference Proceeding
State Skip LFSRs: Bridging the Gap between Test Data Compression and Test Set Embedding for IP Cores
Tenentes, V., Kavousianos, X., Kalligeros, E.
Published in 2008 Design, Automation and Test in Europe (01.03.2008)
Published in 2008 Design, Automation and Test in Europe (01.03.2008)
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Conference Proceeding
Test Scheduling for Multicore SoCs with Dynamic Voltage Scaling and Multiple Voltage Islands
Kavousianos, X., Chakrabarty, K., Jain, A., Parekhji, R.
Published in 2011 Asian Test Symposium (01.11.2011)
Published in 2011 Asian Test Symposium (01.11.2011)
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Conference Proceeding
Generation of compact test sets with high defect coverage
Kavousianos, X., Chakrabarty, K.
Published in 2009 Design, Automation & Test in Europe Conference & Exhibition (01.04.2009)
Published in 2009 Design, Automation & Test in Europe Conference & Exhibition (01.04.2009)
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Conference Proceeding