by Jaleh, B., Parvin, P., Katoozi, M., Zamani, Z., Zare, A.
Published in Radiation measurements (01.11.2005)

by Gossett, C.A., Hughlock, B.W., Katoozi, M., LaRue, G.S., Wender, S.A.
Published in IEEE transactions on nuclear science (01.12.1993)

by Katoozi, M., Soma, M.
Published in IEEE journal of solid-state circuits (01.04.1990)

by Katoozi, M., Nordsieck, A.W.
Published in IEEE journal of solid-state circuits (01.01.1992)

by Katoozi, M., Soma, M.
Published in IEEE journal of solid-state circuits (01.10.1988)

by Katoozi, M., Nordsieck, A.
Published in 1991, Proceedings. International Test Conference (1991)

by Soo Youn Kim, Panagopoulos, G., Chih-Hsiang Ho, Katoozi, M., Cannon, E., Roy, K.
Published in 2013 IEEE International Reliability Physics Symposium (IRPS) (01.04.2013)

by Katoozi, M., Cannon, E. H., Tuan Dao, Aitken, K., Fischer, S., Amort, T., Brees, R., Tostenrude, J.
Published in 2013 IEEE International Reliability Physics Symposium (IRPS) (01.04.2013)

by Katoozi, M., Kutz, H., Soma, M., Huynh, S.
Published in Proceedings 1997 IEEE Multi-Chip Module Conference (1997)

by Katoozi, M., Soma, M.
Published in 1989 IEEE International Symposium on Circuits and Systems (ISCAS) (1989)

by Katoozi, M., Soma, M.
Published in 1989 Proceedings of the IEEE Custom Integrated Circuits Conference (1989)

by Katoozi, M., Soma, M.
Published in International Test Conference 1988 Proceeding@m_New Frontiers in Testing (1988)