AdaBalGAN: An Improved Generative Adversarial Network With Imbalanced Learning for Wafer Defective Pattern Recognition
Wang, Junliang, Yang, Zhengliang, Zhang, Jie, Zhang, Qihua, Chien, Wei-Ting Kary
Published in IEEE transactions on semiconductor manufacturing (01.08.2019)
Published in IEEE transactions on semiconductor manufacturing (01.08.2019)
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Journal Article
Fast Semiconductor Reliability Assessments Using SPRT
Chien, Wei-Ting Kary, Chung, Andrew, Kuo, Way
Published in IEEE transactions on reliability (01.06.2019)
Published in IEEE transactions on reliability (01.06.2019)
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Journal Article
Apply DFT Integrated Enhanced EBAC Methodology on Defect Isolations
Kary Chien, Wei-Ting, Lester Yin, Yuanzi
Published in Journal of failure analysis and prevention (01.12.2018)
Published in Journal of failure analysis and prevention (01.12.2018)
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Journal Article
Statistical Process Control for Monitoring the Particles With Excess Zero Counts in Semiconductor Manufacturing
Tian, Wenxing, You, Hailong, Zhang, Chunfu, Kang, Sheng, Jia, Xinzhang, Chien, Wei-Ting Kary
Published in IEEE transactions on semiconductor manufacturing (01.02.2019)
Published in IEEE transactions on semiconductor manufacturing (01.02.2019)
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Journal Article
A Study On The Dielectric Intrinsic Breakdown Specification
Han, Kun, Zhao, Yong A., Guo, Qiang, Chien, Wei-Ting Kary
Published in ECS transactions (16.03.2012)
Published in ECS transactions (16.03.2012)
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Journal Article
Advanced delayer methods for TEM sample preparations
Chunyan Fan, Shuqing Duan, Ming Li, May Han, Liu Chen, Zhang, Mark, Wei-Ting Kary Chien
Published in 2017 IEEE 24th International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA) (01.07.2017)
Published in 2017 IEEE 24th International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA) (01.07.2017)
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Conference Proceeding
Early detection and prediction of HKMG SRAM HTOL performance by WLR PBTI tests
Chien, Wei-Ting Kary, Zhao, Yong Atman, Zhu, Yueqin, Song, Yongliang
Published in Microelectronics and reliability (01.09.2016)
Published in Microelectronics and reliability (01.09.2016)
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Journal Article
Burn-in effect on yield
Kim, Taeho, Kuo, Way, Chien, Wei-Ting Kary
Published in IEEE transactions on electronics packaging manufacturing (01.10.2000)
Published in IEEE transactions on electronics packaging manufacturing (01.10.2000)
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Journal Article
Use of the dirichlet process for reliability analysis
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Journal Article
Conference Proceeding
Burn-in effect on yield
Kim, Taeho, Kuo, Way, Chien, Wei-Ting Kary
Published in IEEE transactions on electronics packaging manufacturing (01.10.2000)
Published in IEEE transactions on electronics packaging manufacturing (01.10.2000)
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Journal Article
Finding voids in dual damascene Cu vias and their impact on reliability
Dong, W., Ji, J., Sanan Liang, Zhang, M., Liao, S., Chorng Niou, Wei-Ting Kary Chien
Published in 2004 IEEE International Reliability Physics Symposium. Proceedings (2004)
Published in 2004 IEEE International Reliability Physics Symposium. Proceedings (2004)
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Conference Proceeding
Exploration of poly Irms based on 40nm technology node
Xiang Fu Zhao, Wei Ting Kary Chien, Yang, Kelly
Published in 2017 China Semiconductor Technology International Conference (CSTIC) (01.03.2017)
Published in 2017 China Semiconductor Technology International Conference (CSTIC) (01.03.2017)
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Conference Proceeding
A method to group reliability data by hierarchical clustering
Sheng Kang, Chien, Wei-Ting Kary
Published in 2016 IEEE International Conference on Industrial Engineering and Engineering Management (IEEM) (01.12.2016)
Published in 2016 IEEE International Conference on Industrial Engineering and Engineering Management (IEEM) (01.12.2016)
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Conference Proceeding