A Physical TCAD Mobility Model of Amorphous In-Ga-Zn-O (a-IGZO) Devices with Spatially Varying Mobility Edges, Band-Tails, and Enhanced Low-Temperature Convergence
Thesberg, Mischa, Schanovsky, Franz, Zhao, Ying, Karner, Markus, Gonzalez-Medina, Jose Maria, Stanojević, Zlatan, Chasin, Adrian, Rzepa, Gerhard
Published in Micromachines (Basel) (27.06.2024)
Published in Micromachines (Basel) (27.06.2024)
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Journal Article
Effect of Mask Geometry Variation on Plasma Etching Profiles
Bobinac, Josip, Reiter, Tobias, Piso, Julius, Klemenschits, Xaver, Baumgartner, Oskar, Stanojevic, Zlatan, Strof, Georg, Karner, Markus, Filipovic, Lado
Published in Micromachines (Basel) (16.03.2023)
Published in Micromachines (Basel) (16.03.2023)
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Journal Article
Consistent low-field mobility modeling for advanced MOS devices
Stanojević, Zlatan, Baumgartner, Oskar, Filipović, Lidija, Kosina, Hans, Karner, Markus, Kernstock, Christian, Prause, Philipp
Published in Solid-state electronics (01.10.2015)
Published in Solid-state electronics (01.10.2015)
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Journal Article
A multi-purpose Schrödinger-Poisson Solver for TCAD applications
Karner, Markus, Gehring, Andreas, Holzer, Stefan, Pourfath, Mahdi, Wagner, Martin, Goes, Wolfgang, Vasicek, Martin, Baumgartner, Oskar, Kernstock, Christian, Schnass, Klaus, Zeiler, Gerhard, Grasser, Tibor, Kosina, Hans, Selberherr, Siegfried
Published in Journal of computational electronics (01.09.2007)
Published in Journal of computational electronics (01.09.2007)
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Journal Article
A Model for Switching Traps in Amorphous Oxides
Goes, W., Grasser, T., Karner, M., Kaczer, B.
Published in 2009 International Conference on Simulation of Semiconductor Processes and Devices (01.09.2009)
Published in 2009 International Conference on Simulation of Semiconductor Processes and Devices (01.09.2009)
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Conference Proceeding
Modeling the Operation of Charge Trap Flash Memory-Part II: Understanding the ISPP Curve With a Semianalytical Model
Verreck, Devin, Schanovsky, Franz, Arreghini, Antonio, Van den Bosch, Geert, Stanojevic, Zlatan, Karner, Markus, Rosmeulen, Maarten
Published in IEEE transactions on electron devices (01.01.2024)
Published in IEEE transactions on electron devices (01.01.2024)
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Journal Article
Nano Device Simulator-A Practical Subband-BTE Solver for Path-Finding and DTCO
Stanojevic, Zlatan, Tsai, Chen-Ming, Strof, Georg, Mitterbauer, Ferdinand, Baumgartner, Oskar, Kernstock, Christian, Karner, Markus
Published in IEEE transactions on electron devices (01.11.2021)
Published in IEEE transactions on electron devices (01.11.2021)
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Journal Article
DTCO flow for air spacer generation and its impact on power and performance at N7
Filipovic, Lado, Baumgartner, Oskar, Klemenschits, Xaver, Piso, Julius, Bobinac, Josip, Reiter, Tobias, Strof, Georg, Rzepa, Gerhard, Stanojevic, Zlatan, Karner, Markus
Published in Solid-state electronics (01.01.2023)
Published in Solid-state electronics (01.01.2023)
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Journal Article
A Novel Approach to Modeling Insulator Wave-Function Penetration and Interface Roughness Scattering in MOSFETs
Stanojevic, Zlatan, Hung, Lee-Chi, Tsai, Chen-Ming, Karner, Markus
Published in ESSDERC 2022 - IEEE 52nd European Solid-State Device Research Conference (ESSDERC) (19.09.2022)
Published in ESSDERC 2022 - IEEE 52nd European Solid-State Device Research Conference (ESSDERC) (19.09.2022)
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Conference Proceeding
On the Modeling of Polycrystalline Ferroelectric Thin Films: Landau-Based Models Versus Monte Carlo-Based Models Versus Experiment
Thesberg, Mischa, Alam, Md Nur K., Truijen, Brecht, Kaczer, Ben, Roussel, Philippe J., Stanojevic, Zlatan, Baumgartner, Oskar, Schanovsky, Franz, Karner, Markus, Kosina, Hans
Published in IEEE transactions on electron devices (01.06.2022)
Published in IEEE transactions on electron devices (01.06.2022)
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Journal Article
VSP—a quantum-electronic simulation framework
Baumgartner, Oskar, Stanojevic, Zlatan, Schnass, Klaus, Karner, Markus, Kosina, Hans
Published in Journal of computational electronics (01.12.2013)
Published in Journal of computational electronics (01.12.2013)
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Journal Article
Overview of emerging semiconductor device model methodologies: From device physics to machine learning engines
Li, Xufan, Wu, Zhenhua, Rzepa, Gerhard, Karner, Markus, Xu, Haoqing, Wu, Zhicheng, Wang, Wei, Yang, Guanhua, Luo, Qing, Wang, Lingfei, Li, Ling
Published in Fundamental research (Beijing) (01.02.2024)
Published in Fundamental research (Beijing) (01.02.2024)
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Journal Article
Source-to-drain Tunneling Analysis in p-type Si and Ge Based NWTs/NSTs
Hung, Lee-Chi, Stanojevic, Zlatan, Tsai, Chen-Ming, Karner, Markus, Chen, Edward
Published in 2023 International Conference on Simulation of Semiconductor Processes and Devices (SISPAD) (27.09.2023)
Published in 2023 International Conference on Simulation of Semiconductor Processes and Devices (SISPAD) (27.09.2023)
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Conference Proceeding