Search Results - "Kariat, Vinod" :: K.UTB vyhledávací portál | TBU Library Retrieval Portal

Challenges in gate level modeling for delay and SI at 65nm and below

Challenges in gate level modeling for delay and SI at 65nm and below

by Keller, Igor, Tam, King Ho, Kariat, Vinod
Published in 2008 45th ACM/IEEE Design Automation Conference (08.06.2008)

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Conference Proceeding

Static noise analysis with noise windows

Static noise analysis with noise windows

by Tseng, Ken, Kariat, Vinod
Published in Annual ACM IEEE Design Automation Conference: Proceedings of the 40th conference on Design automation; 02-06 June 2003 (02.06.2003)

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Conference Proceeding

Emerging topics in signal integrity and reliability

Emerging topics in signal integrity and reliability

by Alam, Syed, Kariat, Vinod
Published in International Conference on Computer Aided Design: Proceedings of the 2006 IEEE/ACM international conference on Computer-aided design : San Jose, California (01.01.2006)

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Conference Proceeding

Method and apparatus for multi-die thermal analysis

Method and apparatus for multi-die thermal analysis

by KARIAT VINOD, PRAMONO EDDY, ZHAN YONG
Year of Publication 08.04.2014

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Patent

Methods, systems, and apparatus for timing and signal integrity analysis of integrated circuits with semiconductor process variations

Methods, systems, and apparatus for timing and signal integrity analysis of integrated circuits with semiconductor process variations

by PHILLIPS JOEL R, KELLER IGOR, KARIAT VINOD
Year of Publication 14.01.2014

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Patent

Method and apparatus for multi-die thermal analysis

Method and apparatus for multi-die thermal analysis

by KARIAT VINOD, PRAMONO EDDY, ZHAN YONG
Year of Publication 22.10.2013

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Patent

Method and apparatus for thermal analysis of through-silicon via (TSV)

Method and apparatus for thermal analysis of through-silicon via (TSV)

by KARIAT VINOD, PRAMONO EDDY, ZHAN YONG
Year of Publication 24.09.2013

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Patent

Method and apparatus for thermal analysis

Method and apparatus for thermal analysis

by KARIAT VINOD, PRAMONO EDDY, ZHAN YONG
Year of Publication 06.08.2013

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Patent

Static timing analysis of integrated circuit designs with flexible noise and delay models of circuit stages

Static timing analysis of integrated circuit designs with flexible noise and delay models of circuit stages

by KELLER IGOR, KARIAT VINOD, TAM KING HO
Year of Publication 08.09.2015

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Patent

METHOD AND APPARATUS FOR MULTI-DIE THERMAL ANALYSIS

METHOD AND APPARATUS FOR MULTI-DIE THERMAL ANALYSIS

by KARIAT VINOD, PRAMONO EDDY, ZHAN YONG
Year of Publication 29.11.2012

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Patent

METHOD AND APPARATUS FOR MULTI-DIE THERMAL ANALYSIS

METHOD AND APPARATUS FOR MULTI-DIE THERMAL ANALYSIS

by KARIAT VINOD, PRAMONO EDDY, ZHAN YONG
Year of Publication 22.11.2012

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Patent

METHOD AND APPARATUS FOR THERMAL ANALYSIS OF THROUGH-SILICON VIA (TSV)

METHOD AND APPARATUS FOR THERMAL ANALYSIS OF THROUGH-SILICON VIA (TSV)

by KARIAT VINOD, PRAMONO EDDY, ZHAN YONG
Year of Publication 16.08.2012

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Patent

Method and apparatus for multi-die thermal analysis

Method and apparatus for multi-die thermal analysis

by Pramono, Eddy, Zhan, Yong, Kariat, Vinod
Year of Publication 12.06.2012

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Patent

Method and apparatus for multi-die thermal analysis

Method and apparatus for multi-die thermal analysis

by KARIAT VINOD, PRAMONO EDDY, ZHAN YONG
Year of Publication 12.06.2012

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Patent

METHOD AND APPARATUS FOR THERMAL ANALYSIS

METHOD AND APPARATUS FOR THERMAL ANALYSIS

by KARIAT VINOD, PRAMONO EDDY, ZHAN YONG
Year of Publication 26.04.2012

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Patent

Method and apparatus for thermal analysis

Method and apparatus for thermal analysis

by Kariat, Vinod, Keller, Igor, Pramono, Eddy
Year of Publication 24.01.2012

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Patent

Method and apparatus for thermal analysis

Method and apparatus for thermal analysis

by Kariat, Vinod, Pramono, Eddy, Zhan, Yong
Year of Publication 24.01.2012

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Patent

Method and apparatus for thermal analysis of through-silicon via (TSV)

Method and apparatus for thermal analysis of through-silicon via (TSV)

by KARIAT VINOD, PRAMONO EDDY, ZHAN YONG
Year of Publication 24.01.2012

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Patent

Method and apparatus for thermal analysis

Method and apparatus for thermal analysis

by KELLER IGOR, KARIAT VINOD, PRAMONO EDDY
Year of Publication 24.01.2012

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Patent

Method and apparatus for thermal analysis

Method and apparatus for thermal analysis

by KARIAT VINOD, PRAMONO EDDY, ZHAN YONG
Year of Publication 24.01.2012

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Patent