Influence of AC signal oscillator level on effective mobility measurement by split C–V technique in MOSFETs
Karatsori, T.A, Theodorou, C.G, Dimitriadis, C.A, Ghibaudo, G
Published in Electronics letters (18.08.2016)
Published in Electronics letters (18.08.2016)
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Journal Article
Threshold voltage of p-type triple-gate junctionless transistors
Oproglidis, T.A., Tassis, D.H., Tsormpatzoglou, A., Karatsori, T.A., Theodorou, C.G., Barraud, S., Ghibaudo, G., Dimitriadis, C.A.
Published in Solid-state electronics (01.11.2022)
Published in Solid-state electronics (01.11.2022)
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Journal Article
Leakage current conduction in metal gate junctionless nanowire transistors
Oproglidis, T.A., Karatsori, T.A., Barraud, S., Ghibaudo, G., Dimitriadis, C.A.
Published in Solid-state electronics (01.05.2017)
Published in Solid-state electronics (01.05.2017)
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Journal Article
Static and low frequency noise characterization of ultra-thin body InAs MOSFETs
Karatsori, T.A., Pastorek, M., Theodorou, C.G., Fadjie, A., Wichmann, N., Desplanque, L., Wallart, X., Bollaert, S., Dimitriadis, C.A., Ghibaudo, G.
Published in Solid-state electronics (01.05.2018)
Published in Solid-state electronics (01.05.2018)
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Journal Article
Static and low frequency noise characterization of ultra-thin body InAs MOSFETs
Karatsori, T. A., Pastorek, M., Theodorou, C. G., Fadjie, A., Wichmann, N., Desplanque, L., Wallart, X., Bollaert, S., Dimitriadis, C. A., Ghibaudo, G.
Published in 2017 Joint International EUROSOI Workshop and International Conference on Ultimate Integration on Silicon (EUROSOI-ULIS) (01.04.2017)
Published in 2017 Joint International EUROSOI Workshop and International Conference on Ultimate Integration on Silicon (EUROSOI-ULIS) (01.04.2017)
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Conference Proceeding