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Comparative study of the roughness of optical surfaces and thin films by use of X-ray scattering and atomic force microscopy
by
Asadchikov, V E
,
Duparré, A
,
Jakobs, S
,
Karabekov
,
A Y
,
Kozhevnikov, I V
,
Krivonosov, Y S
Published in
Applied optics (2004)
(01.02.1999)
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Journal Article
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physics
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optics
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physical sciences
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English
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