Gilbert damping of high anisotropy Co/Pt multilayers
Devolder, Thibaut, Couet, S, Swerts, J, Kar, G S
Published in Journal of physics. D, Applied physics (04.04.2018)
Published in Journal of physics. D, Applied physics (04.04.2018)
Get full text
Journal Article
SOT-MRAM Based Analog in-Memory Computing for DNN Inference
Doevenspeck, J., Garello, K., Verhoef, B., Degraeve, R., Van Beek, S., Crotti, D., Yasin, F., Couet, S., Jayakumar, G., Papistas, I. A, Debacker, P., Lauwereins, R., Dehaene, W., Kar, G. S., Cosemans, S., Mallik, A., Verkest, D.
Published in 2020 IEEE Symposium on VLSI Technology (01.06.2020)
Published in 2020 IEEE Symposium on VLSI Technology (01.06.2020)
Get full text
Conference Proceeding
Kinetic evolution and equilibrium morphology of strained islands
Rastelli, A, Stoffel, M, Tersoff, J, Kar, G S, Schmidt, O G
Published in Physical review letters (08.07.2005)
Published in Physical review letters (08.07.2005)
Get more information
Journal Article
Highly Scaled Vertical Cylindrical SONOS Cell With Bilayer Polysilicon Channel for 3-D nand Flash Memory
Van den bosch, G., Kar, G. S., Blomme, P., Arreghini, A., Cacciato, A., Breuil, L., De Keersgieter, A., Paraschiv, V., Vrancken, C., Douhard, B., Richard, O., Van Aerde, S., Debusschere, I., Van Houdt, J.
Published in IEEE electron device letters (01.11.2011)
Published in IEEE electron device letters (01.11.2011)
Get full text
Journal Article
Study of precessional switching speed control in voltage-controlled perpendicular magnetic tunnel junction
Wu, Y. C., Kim, W., Couet, S., Garello, K., Rao, S., Van Beek, S., Kundu, S., Houshmand Sharifi, S., Crotti, D., Van Houdt, J., Groeseneken, G., Kar, G. S.
Published in AIP advances (01.03.2020)
Published in AIP advances (01.03.2020)
Get full text
Journal Article
Material distribution across the interface of random and ordered island arrays
Kar, G S, Kiravittaya, S, Stoffel, M, Schmidt, O G
Published in Physical review letters (10.12.2004)
Published in Physical review letters (10.12.2004)
Get more information
Journal Article
Manufacturable 300mm platform solution for Field-Free Switching SOT-MRAM
Garello, K., Yasin, F., Hody, H., Couet, S., Souriau, L., Sharifi, S. H., Swerts, J., Carpenter, R., Rao, S., Kim, W., Wu, J., Sethu, K.K.V., Pak, M., Jossart, N., Crotti, D., Furnemont, A., Kar, G. S.
Published in 2019 Symposium on VLSI Technology (01.06.2019)
Published in 2019 Symposium on VLSI Technology (01.06.2019)
Get full text
Conference Proceeding
Manufacturable 300mm platform solution for Field-Free Switching SOT-MRAM
Garello, K., Yasin, F., Hody, H., Couet, S., Souriau, L., Sharifi, S. H., Swerts, J., Carpenter, R., Rao, S., Kim, W., Wu, J., Sethu, K. K. V., Pak, M., Jossart, N., Crotti, D., Furnemont, A., Kar, G. S.
Published in 2019 Symposium on VLSI Circuits (01.06.2019)
Published in 2019 Symposium on VLSI Circuits (01.06.2019)
Get full text
Conference Proceeding
Offset fields in perpendicularly magnetized tunnel junctions
Devolder, T, Carpenter, R, Rao, S, Kim, W, Couet, S, Swerts, J, Kar, G S
Published in Journal of physics. D, Applied physics (03.07.2019)
Published in Journal of physics. D, Applied physics (03.07.2019)
Get full text
Journal Article
A HydroDynamic Model for Trap-Assisted Tunneling Conduction in Ovonic Devices
Buscemi, F., Piccinini, E., Vandelli, L., Nardi, F., Padovani, A., Kaczer, B., Garbin, D., Clima, S., Degraeve, R., Kar, G. S., Tavanti, F., Slassi, A., Calzolari, A., Larcher, L.
Published in IEEE transactions on electron devices (01.04.2023)
Published in IEEE transactions on electron devices (01.04.2023)
Get full text
Journal Article
Optimization of gate stack parameters towards 3D-SONOS application
Breuil, L., Van den bosch, G., Cacciato, A., Date, L., Kar, G.S., Tang, B., Arreghini, A., Debusschere, I., Van Houdt, J.
Published in Microelectronic engineering (01.07.2011)
Published in Microelectronic engineering (01.07.2011)
Get full text
Journal Article
Conference Proceeding
Magnetic Domain Wall Memory: A DTCO study for Memory Applications
Gupta, M., Rao, S., Kar, G.S., Couet, S.
Published in ESSDERC 2023 - IEEE 53rd European Solid-State Device Research Conference (ESSDERC) (11.09.2023)
Published in ESSDERC 2023 - IEEE 53rd European Solid-State Device Research Conference (ESSDERC) (11.09.2023)
Get full text
Conference Proceeding
Magnetic Coupling Based Test Development for Contact and Interconnect Defects in STT-MRAMs
Yuan, S., Zhang, Z., Fieback, M., Xun, H., Marinissen, E. J., Kar, G. S., Rao, S., Couet, S., Taouil, M., Hamdioui, S.
Published in 2023 IEEE International Test Conference (ITC) (07.10.2023)
Published in 2023 IEEE International Test Conference (ITC) (07.10.2023)
Get full text
Conference Proceeding
Design-technology co-optimization for OxRRAM-based synaptic processing unit
Mallik, A., Garbin, D., Fantini, A., Rodopoulos, D., Degraeve, R., Stuijt, J., Das, A. K., Schaafsma, S., Debacker, P., Donadio, G., Hody, H., Goux, L., Kar, G. S., Furnemont, A., Mocuta, A., Raghavan, P.
Published in 2017 Symposium on VLSI Technology (01.06.2017)
Published in 2017 Symposium on VLSI Technology (01.06.2017)
Get full text
Conference Proceeding
Material relaxation in chalcogenide OTS SELECTOR materials
Clima, S., Garbin, D., Devulder, W., Keukelier, J., Opsomer, K., Goux, L., Kar, G.S., Pourtois, G.
Published in Microelectronic engineering (15.07.2019)
Published in Microelectronic engineering (15.07.2019)
Get full text
Journal Article
Impact of gate stack processing on the hysteresis of 300 mm integrated WS2 FETs
Panarella, L., Kaczer, B., Smets, Q., Verreck, D., Schram, T., Cott, D., Lin, D., Tyaginov, S., Asselberghs, I., de la Rosa, C. Lockhart, Kar, G. S., Afanas'ev, V.
Published in 2023 IEEE International Reliability Physics Symposium (IRPS) (01.03.2023)
Published in 2023 IEEE International Reliability Physics Symposium (IRPS) (01.03.2023)
Get full text
Conference Proceeding
Degradation mapping of IGZO TFTs
Rinaudo, P., Chasin, A., Franco, J., Wu, Z., Rassoul, N., Delhougne, R., Kaczer, B., Wolf, I. De, Kar, G.S.
Published in 2022 IEEE International Integrated Reliability Workshop (IIRW) (09.10.2022)
Published in 2022 IEEE International Integrated Reliability Workshop (IIRW) (09.10.2022)
Get full text
Conference Proceeding
Integration of epitaxial monolayer MX₂ channels on 300mm wafers via Collective-Die-To-Wafer (CoD2W) transfer
Ghosh, S., Smets, Q., Banerjee, S., Schram, T., Kennes, K., Verheyen, R., Kumar, P., Boulon, M.-E., Groven, B., Silva, H. M., Kundu, S., Cott, D., Lin, D., Favia, P., Nuytten, T., Phommahaxay, A., Asselberghs, I., De La Rosa, C., Kar, G. S., Brems, S.
Published in 2023 IEEE Symposium on VLSI Technology and Circuits (VLSI Technology and Circuits) (11.06.2023)
Published in 2023 IEEE Symposium on VLSI Technology and Circuits (VLSI Technology and Circuits) (11.06.2023)
Get full text
Conference Proceeding
Understanding of Tunable Selector Performance in Si-Ge-As-Se OTS Devices by Extended Percolation Cluster Model Considering Operation Scheme and Material Design
Kabuyanagi, S., Garbin, D., Fantini, A., Clima, S., Degraeve, R., Donadio, G. L., Devulder, W., Delhougne, R., Cellier, D., Cockburn, A., Kim, W. G., Pakala, M., Suzuki, M., Goux, L., Kar, G. S.
Published in 2020 IEEE Symposium on VLSI Technology (01.06.2020)
Published in 2020 IEEE Symposium on VLSI Technology (01.06.2020)
Get full text
Conference Proceeding
Deterministic and Field-Free Voltage-Controlled MRAM for High Performance and Low Power Applications
Wu, Y. C., Kim, W., Garello, K., Yasin, F., Jayakumar, G., Couet, S., Carpenter, R., Kundu, S., Rao, S., Crotti, D., Van Houdt, J., Groeseneken, G., Kar, G. S.
Published in 2020 IEEE Symposium on VLSI Technology (01.06.2020)
Published in 2020 IEEE Symposium on VLSI Technology (01.06.2020)
Get full text
Conference Proceeding