Method and system for determining sample composition from spectral data
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Year of Publication 10.01.2023
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Year of Publication 10.01.2023
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Study of the Changes on the Electrode Structure at High Temperature Load by Scanning Electron Microscope
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Published in ECS transactions (04.12.2017)
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METHOD AND SYSTEM FOR DETERMINING SAMPLE COMPOSITION FROM SPECTRAL DATA BY RETRAINING A NEURAL NETWORK
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Year of Publication 01.05.2024
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Year of Publication 13.02.2024
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METHOD AND SYSTEM FOR DETERMINING SAMPLE COMPOSITION FROM SPECTRAL DATA
KLUSCÁEK, Jan, MACHEK, Ondrej, KAPLENKO, Mykola, KAPLENKO, Oleksii, TÛMA, Tomás
Year of Publication 05.01.2023
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Year of Publication 05.01.2023
Patent
METHOD AND SYSTEM FOR DETERMINING SAMPLE COMPOSITION FROM SPECTRAL DATA BY RETRAINING A NEURAL NETWORK
MACHEK, Ondrej, KAPLENKO, Mykola, KAPLENKO, Oleksii, KLUSACEK, Jan, TUMA, Tomá
Year of Publication 04.01.2023
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Year of Publication 04.01.2023
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METHOD OF ALIGNING A CHARGED PARTICLE BEAM APPARATUS
MACHEK, Ondrej, Schoenmakers, Remco, KAPLENKO, Mykola, KAPLENKO, Oleksii
Year of Publication 09.02.2022
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Year of Publication 09.02.2022
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METHOD OF ALIGNING A CHARGED PARTICLE BEAM APPARATUS
MACHEK, Ondrej, SCHOENMAKERS, Remco, KAPLENKO, Mykola, KAPLENKO, Oleksii
Year of Publication 03.02.2022
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Year of Publication 03.02.2022
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DATA ACQUISITION AND PROCESSING TECHNIQUES FOR THREE-DIMENSIONAL RECONSTRUCTION
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Year of Publication 25.10.2023
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Year of Publication 25.10.2023
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DATA ACQUISITION AND PROCESSING TECHNIQUES FOR THREE-DIMENSIONAL RECONSTRUCTION
Vystavel, Tomás, Kaplenko, Oleksii, Van Leer, Brandon, Machek, Ondrej, Kaplenko, Mykola, Wandrol, Petr
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Year of Publication 06.07.2022
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METHOD OF EXAMINING A SAMPLE USING A CHARGED PARTICLE BEAM APPARATUS
Vystavel, Tomás, Kaplenko, Oleksii, Machek, Ondrej, Bukvisová, Kristýna, Klusácek, Jan, Kaplenko, Mykola
Year of Publication 03.03.2022
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Year of Publication 03.03.2022
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METHOD OF EXAMINING A SAMPLE USING A CHARGED PARTICLE BEAM APPARATUS
Kaplenko, Oleksii, Klusá ek, Jan, Vystav l, Tomá, Machek, Ond ej, Kaplenko, Mykola, Bukvi ová, Kristýna
Year of Publication 02.03.2022
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Year of Publication 02.03.2022
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Method of examining a sample using a charged particle beam apparatus
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Year of Publication 14.11.2023
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Year of Publication 14.11.2023
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Method and system for determining sample composition from spectral data
KAPLENKO, MYKOLA, KAPLENKO, OLEKSII, KLUSACEK, JAN, TUMA, TOMAS, MACHEK, ONDREJ
Year of Publication 16.04.2023
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Year of Publication 16.04.2023
Patent