Quantitative analysis of layering and in-plane structural ordering at an alumina–aluminum solid–liquid interface
Kauffmann, Y., Oh, S.H., Koch, C.T., Hashibon, A., Scheu, C., Rühle, M., Kaplan, W.D.
Published in Acta materialia (01.06.2011)
Published in Acta materialia (01.06.2011)
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Journal Article
experimental method for calibration of the plasmon mean free path
MELTZMAN, H, KAUFFMANN, Y, THANGADURAI, P, DROZDOV, M, BARAM, M, BRANDON, D, KAPLAN, W.D
Published in Journal of microscopy (Oxford) (01.12.2009)
Published in Journal of microscopy (Oxford) (01.12.2009)
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Journal Article
Preface to the Special Section E-MRS MACAN
Chatain, Dominique, Kaplan, Wayne D., Finnis, Mike, Scheu, Chrisitina
Published in Journal of materials science (01.02.2012)
Published in Journal of materials science (01.02.2012)
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Journal Article
Ordered Liquid Aluminum at the Interface with Sapphire
Oh, S. H, Kauffmann, Y, Scheu, C, Kaplan, W. D, Růhle, M
Published in Science (American Association for the Advancement of Science) (28.10.2005)
Published in Science (American Association for the Advancement of Science) (28.10.2005)
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Journal Article
Nucleation and growth of CVD Al on different types of TiN
Avinun, M, Barel, N, Kaplan, W.D, Eizenberg, M, Naik, M, Guo, T, Chen, L.Y, Mosely, R, Littau, K, Zhou, S, Chen, L
Published in Thin solid films (04.05.1998)
Published in Thin solid films (04.05.1998)
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Journal Article
Conference Proceeding
A review of wetting vs. adsorption, complexions and related phenomena: the Rosetta stone of wetting
Kaplan, W.D., Chatain, D., Wynblatt, P., Carter, W.C.
Published in Journal of materials science (01.09.2013)
Published in Journal of materials science (01.09.2013)
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Journal Article
Orientation relationship of Cu crystals on the sapphire (10-10) m-plane and (10-12) r-plane
Chatain, D., Curiotto, S., Wynblatt, P., Meltzman, H., Kaplan, W.D., Rohrer, G.S.
Published in Journal of crystal growth (15.05.2015)
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Published in Journal of crystal growth (15.05.2015)
Journal Article
Orientation relationships of copper crystals on c-plane sapphire
Curiotto, Stefano, Chien, Harry, Meltzman, Hila, Wynblatt, Paul, Rohrer, Gregory S., Kaplan, Wayne D., Chatain, Dominique
Published in Acta materialia (01.08.2011)
Published in Acta materialia (01.08.2011)
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Journal Article
The equilibrium shape of nickel
Meltzman, Hila, Chatain, D., Avizemer, Dan, Besmann, T.M., Kaplan, W.D.
Published in Acta materialia (2011)
Published in Acta materialia (2011)
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Journal Article
Copper crystals on the (110) sapphire plane: orientation relationships, triple line ridges and interface shape equilibrium
Curiotto, Stefano, Chien, Harry, Meltzman, Hila, Labat, Stephane, Wynblatt, Paul, Rohrer, Gregory S., Kaplan, Wayne D., Chatain, Dominique
Published in Journal of materials science (01.04.2013)
Published in Journal of materials science (01.04.2013)
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Journal Article
Laser cladding of turbine blades
Shepeleva, L., Medres, B., Kaplan, W.D., Bamberger, M., Weisheit, A.
Published in Surface & coatings technology (01.03.2000)
Published in Surface & coatings technology (01.03.2000)
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Journal Article
Conference Proceeding
The influence of electron-beam irradiation on electrical characteristics of metal–insulator–semiconductor capacitors based on a high- k dielectric stack of HfTiSiO(N) and HfTiO(N) layers
Thangadurai, P., Kaplan, W.D., Mikhelashvili, V., Eisenstein, G.
Published in Microelectronics and reliability (01.07.2009)
Published in Microelectronics and reliability (01.07.2009)
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Journal Article
The correlation of the electrical properties with electron irradiation and constant voltage stress for MIS devices based on high- k double layer (HfTiSiO:N and HfTiO:N) dielectrics
Mikhelashvili, V., Thangadurai, P., Kaplan, W.D., Eisenstein, G.
Published in Microelectronic engineering (01.11.2010)
Published in Microelectronic engineering (01.11.2010)
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Journal Article
Microstructure and chemical analysis of Hf-based high-k dielectric layers in metal–insulator–metal capacitors
Thangadurai, P., Mikhelashvili, V., Eisenstein, G., Kaplan, W.D.
Published in Thin solid films (31.05.2010)
Published in Thin solid films (31.05.2010)
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Journal Article
The effect of light irradiation on electrons and holes trapping in nonvolotile memory capacitors employing sub 10nm SiO2–HfO2 stacks and Au nanocrystals
Mikhelashvili, V., Meyler, B., Garbrecht, M., Cohen-Hyams, T., Roizin, Y., Lisiansky, M., Kaplan, W.D., Salzman, Y., Eisenstein, G.
Published in Microelectronic engineering (01.06.2011)
Published in Microelectronic engineering (01.06.2011)
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Journal Article
The effect of light irradiation on electrons and holes trapping in nonvolotile memory capacitors employing sub 10 nm SiO 2–HfO 2 stacks and Au nanocrystals
Mikhelashvili, V., Meyler, B., Garbrecht, M., Cohen-Hyams, T., Roizin, Y., Lisiansky, M., Kaplan, W.D., Salzman, Y., Eisenstein, G.
Published in Microelectronic engineering (2011)
Published in Microelectronic engineering (2011)
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Journal Article