Use of scalable Parametric Measurement Macro to improve semiconductor technology characterization and product test
Bickford, Jeanne, Habib, Nazmul, Goss, John, McMahon, Robert, Joshi, Rajiv V, Kanj, Rouwaida N
Published in 2010 11th International Symposium on Quality Electronic Design (ISQED) (01.03.2010)
Published in 2010 11th International Symposium on Quality Electronic Design (ISQED) (01.03.2010)
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Conference Proceeding
Yield estimation of SRAM circuits using "Virtual SRAM Fab"
Bansal, A., Singh, R.N., Kanj, R.N., Mukhopadhyay, S., Jin-Fuw Lee, Acar, E., Singhee, A., Keunwoo Kim, Ching-Te Chuang, Nassif, S., Fook-Luen Heng, Das, K.K.
Published in 2009 IEEE/ACM International Conference on Computer-Aided Design - Digest of Technical Papers (02.11.2009)
Published in 2009 IEEE/ACM International Conference on Computer-Aided Design - Digest of Technical Papers (02.11.2009)
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Conference Proceeding
A More Effective Ceff for Slew Estimation
Ying Zhou, Zhuo Li, Kanj, R.N., Papa, D.A., Nassif, S., Weiping Shi
Published in 2007 IEEE International Conference on Integrated Circuit Design and Technology (01.05.2007)
Published in 2007 IEEE International Conference on Integrated Circuit Design and Technology (01.05.2007)
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Conference Proceeding
Document tagging and retrieval using entity specifiers
Gattiker, Anne Elizabeth, Gebara, Fadi H, Kanj, Rouwaida N, Hylick, Anthony N
Year of Publication 15.05.2018
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Year of Publication 15.05.2018
Patent
DOCUMENT RETRIEVAL USING INTERNAL DICTIONARY-HIERARCHIES TO ADJUST PER-SUBJECT MATCH RESULTS
Gattiker Anne Elizabeth, Gebara Fadi H, Kanj Rouwaida N, Hylick Anthony N
Year of Publication 13.10.2016
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Year of Publication 13.10.2016
Patent
Document retrieval using internal dictionary-hierarchies to adjust per-subject match results
Gattiker Anne Elizabeth, Gebara Fadi H, Kanj Rouwaida N, Hylick Anthony N
Year of Publication 30.08.2016
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Year of Publication 30.08.2016
Patent