Fluoropolymer-based organic memristor with multifunctionality for flexible neural network system
Kim, Min-Hwi, Park, Hea-Lim, Kim, Min-Hoi, Jang, Jaewon, Bae, Jin-Hyuk, Kang, In Man, Lee, Sin-Hyung
Published in Npj flexible electronics (17.12.2021)
Published in Npj flexible electronics (17.12.2021)
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Journal Article
Improved Environment Stability of Y2O3 RRAM Devices with Au Passivated Ag Top Electrodes
Kim, Hae-In, Lee, Taehun, Lee, Won-Yong, Kim, Kyoungdu, Bae, Jin-Hyuk, Kang, In-Man, Lee, Sin-Hyung, Kim, Kwangeun, Jang, Jaewon
Published in Materials (02.10.2022)
Published in Materials (02.10.2022)
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Journal Article
Flexible Sol-Gel—Processed Y2O3 RRAM Devices Obtained via UV/Ozone-Assisted Photochemical Annealing Process
Kim, Hyeon-Joong, Kim, Do-Won, Lee, Won-Yong, Kim, Kyoungdu, Lee, Sin-Hyung, Bae, Jin-Hyuk, Kang, In-Man, Kim, Kwangeun, Jang, Jaewon
Published in Materials (03.03.2022)
Published in Materials (03.03.2022)
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Journal Article
Enhanced Switching Reliability of Sol–Gel-Processed Y2O3 RRAM Devices Based on Y2O3 Surface Roughness-Induced Local Electric Field
Kim, Do-Won, Kim, Hyeon-Joong, Lee, Won-Yong, Kim, Kyoungdu, Lee, Sin-Hyung, Bae, Jin-Hyuk, Kang, In-Man, Kim, Kwangeun, Jang, Jaewon
Published in Materials (05.03.2022)
Published in Materials (05.03.2022)
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Journal Article
Deep Sub-60 mV/decade Subthreshold Swing in AlGaN/GaN FinMISHFETs with M-Plane Sidewall Channel
Quan Dai, Dong-Hyeok Son, Young-Jun Yoon, Jeong-Gil Kim, Xiaoshi Jin, In-Man Kang, Dae-Hyun Kim, Yue Xu, Cristoloveanu, Sorin, Jung-Hee Lee
Published in IEEE transactions on electron devices (01.04.2019)
Published in IEEE transactions on electron devices (01.04.2019)
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Journal Article
UV/Ozone-Treated and Sol–Gel-Processed Y2O3 Insulators Prepared Using Gelation-Delaying Precursors
Lee, Sangwoo, Cho, Yoonjin, Heo, Seongwon, Bae, Jin-Hyuk, Kang, In-Man, Kim, Kwangeun, Lee, Won-Yong, Jang, Jaewon
Published in Nanomaterials (Basel, Switzerland) (01.05.2024)
Published in Nanomaterials (Basel, Switzerland) (01.05.2024)
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Journal Article
Effect of Electrochemically Active Top Electrode Materials on Nanoionic Conductive Bridge Y2O3 Random-Access Memory
Cho, Yoonjin, Lee, Sangwoo, Heo, Seongwon, Bae, Jin-Hyuk, Kang, In-Man, Kim, Kwangeun, Lee, Won-Yong, Jang, Jaewon
Published in Nanomaterials (Basel, Switzerland) (16.03.2024)
Published in Nanomaterials (Basel, Switzerland) (16.03.2024)
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Journal Article
Analysis of the Sensing Margin of Silicon and Poly-Si 1T-DRAM
Kim, Hyeonjeong, Yoo, Songyi, Kang, In-Man, Cho, Seongjae, Sun, Wookyung, Shin, Hyungsoon
Published in Micromachines (Basel) (23.02.2020)
Published in Micromachines (Basel) (23.02.2020)
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Journal Article
Performance comparison between p-i-n and p-n junction tunneling field-effect transistors
Yoon, Young Jun, Seo, Jae Hwa, Man Kang, In
Published in Japanese Journal of Applied Physics (01.06.2018)
Published in Japanese Journal of Applied Physics (01.06.2018)
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Journal Article
Analysis of Multiple Fin-type Vertical GaN Power Transistors based on Bulk GaN Substrates
Heo, Jun-Hyeok, Kang, In-Man, Lee, Sang-Ho, Park, Jin, Min, So-Ra, Kim, Geon-Uk, Kang, Ga-Eon, Jang, Jaewon, Bae, Jin-Hyuk, Lee, Sin-Hyung
Published in Journal of semiconductor technology and science (01.02.2023)
Published in Journal of semiconductor technology and science (01.02.2023)
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Journal Article
Sol–Gel-Processed Y2O3 Multilevel Resistive Random-Access Memory Cells for Neural Networks
Lee, Taehun, Kim, Hae-In, Cho, Yoonjin, Lee, Sangwoo, Lee, Won-Yong, Bae, Jin-Hyuk, Kang, In-Man, Kim, Kwangeun, Lee, Sin-Hyung, Jang, Jaewon
Published in Nanomaterials (Basel, Switzerland) (27.08.2023)
Published in Nanomaterials (Basel, Switzerland) (27.08.2023)
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Journal Article
Non-quasi-static small-signal modeling and analytical parameter extraction of SOI FinFETs
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Journal Article
Conference Proceeding
Electrical Performance Depending on the Grain Boundary-location in the Multiple Nanosheet Tunneling Field-effect Transistor based on the Poly-Si
Kang, Ga-Eon, Kang, In-Man, Lee, Sang-Ho, Park, Jin, Min, So-Ra, Kim, Geon-Uk, Heo, Jun-Hyeok, Jang, Jaewon, Bae, Jin-Hyuk, Lee, Sin-Hyung
Published in Journal of semiconductor technology and science (01.02.2023)
Published in Journal of semiconductor technology and science (01.02.2023)
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Journal Article
Simulation of Capacitorless DRAM Based on the Polycrystalline Silicon Nanotube Structure with Multiple Grain Boundaries
Park, Jin, Lee, Sang-Ho, Kang, Ga-Eon, Heo, Jun-Hyeok, Jeon, So-Ra, Kim, Min-Seok, Bae, Seung-Ji, Hong, Jeong-Woo, Jang, Jae-Won, Bae, Jin-Hyuk, Lee, Sin-Hyung, Kang, In-Man
Published in Nanomaterials (Basel, Switzerland) (07.07.2023)
Published in Nanomaterials (Basel, Switzerland) (07.07.2023)
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Journal Article
Separate Extraction of Gate Resistance Components in RF MOSFETs
Kang, Myounggon, Kang, In Man, Jung, Young Ho, Shin, Hyungcheol
Published in IEEE transactions on electron devices (01.06.2007)
Published in IEEE transactions on electron devices (01.06.2007)
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Journal Article
Effect of Work-function Variation on Transfer Characteristics and Memory Performances for Gate-all-around JLFET based Capacitorless DRAM
Lee, Sang-Ho, Yoon, Young-Jun, Seo, Jae-Hwa, Cho, Min-Su, Park, Jin, An, Hee-Dae, Min, So-Ra, Kim, Geon-Uk, Kang, In-Man
Published in Journal of semiconductor technology and science (01.12.2021)
Published in Journal of semiconductor technology and science (01.12.2021)
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Journal Article
Fabrication and Performances of Recessed Gate AlGaN/GaN MOSFETs with Si₃N₄/TiO₂ Stacked Dual Gate Dielectric
An, Hee-Dae, Bae, Jin-Hyuk, Lee, Sin-Hyung, Kang, In-Man, Min, So-Ra, Lee, Sang-Ho, Park, Jin, Kim, Geon-Uk, Yoon, Young-Jun, Seo, Jae-Hwa, Cho, Min-Su, Jang, Jaewon
Published in Journal of semiconductor technology and science (01.04.2022)
Published in Journal of semiconductor technology and science (01.04.2022)
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Journal Article
Electrical Performances of GaN-based Vertical Trench MOSFETs with Cylindrical and Hexagonal Structure
Kim, Geon-Uk, Yoon, Young-Jun, Seo, Jae-Hwa, Cho, Min-Su, Lee, Sang-Ho, Park, Jin, An, Hee-Dae, Min, So-Ra, Kang, In-Man
Published in Journal of semiconductor technology and science (01.12.2021)
Published in Journal of semiconductor technology and science (01.12.2021)
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Journal Article
The analysis of dark signals in the CMOS APS imagers from the characterization of test structures
Kwon, H.I., Kang, I.M., Park, B.-G., Lee, J.D., Park, S.S.
Published in IEEE transactions on electron devices (01.02.2004)
Published in IEEE transactions on electron devices (01.02.2004)
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Journal Article