Raman scattering as a tool to characterize semiconductor crystals, thin layers, and low-dimensional structures containing transition metals: Raman scattering for characterizing TM-containing semiconductors
Szuszkiewicz, Wojciech, Jouanne, Michel, Morhange, Jean-François, Kanehisa, Makoto, Dynowska, Elżbieta, Gas, Katarzyna, Janik, Elżbieta, Karczewski, Grzegorz, Kuna, Rafał, Wojtowicz, Tomasz
Published in physica status solidi (b) (01.06.2014)
Published in physica status solidi (b) (01.06.2014)
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Journal Article
Raman scattering as a tool to characterize semiconductor crystals, thin layers, and low-dimensional structures containing transition metals
Szuszkiewicz, Wojciech, Jouanne, Michel, Morhange, Jean-François, Kanehisa, Makoto, Dynowska, Elżbieta, Gas, Katarzyna, Janik, Elżbieta, Karczewski, Grzegorz, Kuna, Rafał, Wojtowicz, Tomasz
Published in Physica Status Solidi. B: Basic Solid State Physics (01.06.2014)
Published in Physica Status Solidi. B: Basic Solid State Physics (01.06.2014)
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Journal Article
Néel temperature of zinc-blende, MBE-grown MnTe layers: modification by the crystal growth conditions
Szuszkiewicz, W., Dynowska, E., Domagala, J. Z., Janik, E., Łusakowska, E., Jouanne, M., Morhange, J. F., Kanehisa, M., Ortner, K., Becker, C. R.
Published in Physica status solidi. C (01.03.2004)
Published in Physica status solidi. C (01.03.2004)
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