Deep industrial transfer learning at runtime for image recognition
Maschler, Benjamin, Kamm, Simon, Weyrich, Michael
Published in Automatisierungstechnik : AT (26.03.2021)
Published in Automatisierungstechnik : AT (26.03.2021)
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Journal Article
A survey on machine learning based analysis of heterogeneous data in industrial automation
Kamm, Simon, Veekati, Sushma Sri, Müller, Timo, Jazdi, Nasser, Weyrich, Michael
Published in Computers in industry (01.08.2023)
Published in Computers in industry (01.08.2023)
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Journal Article
Architecture and knowledge modelling for self-organized reconfiguration management of cyber-physical production systems
Müller, Timo, Kamm, Simon, Löcklin, Andreas, White, Dustin, Mellinger, Marius, Jazdi, Nasser, Weyrich, Michael
Published in International journal of computer integrated manufacturing (02.12.2023)
Published in International journal of computer integrated manufacturing (02.12.2023)
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Journal Article
A Novel Architecture for Robust and Adaptive Machine Learning Using Heterogeneous Data in Condition Monitoring of Automation Systems
Kamm, Simon, Suthandhira, Paveen Rajai, Jazdi, Nasser, Weyrich, Michael
Published in 2023 IEEE 28th International Conference on Emerging Technologies and Factory Automation (ETFA) (12.09.2023)
Published in 2023 IEEE 28th International Conference on Emerging Technologies and Factory Automation (ETFA) (12.09.2023)
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Conference Proceeding
InteLiv: An Architecture for Graph-Based Dynamic Context Modeling for Smart Living
Stumpfle, Johannes, Sahlab, Nada, Kamm, Simon, Grimmeisen, Philipp, Jazdi, Nasser, Weyrich, Michael
Published in 2023 IEEE 28th International Conference on Emerging Technologies and Factory Automation (ETFA) (12.09.2023)
Published in 2023 IEEE 28th International Conference on Emerging Technologies and Factory Automation (ETFA) (12.09.2023)
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Conference Proceeding
Time-Domain Reflectometry for Automated Failure Analysis in Power Transistors
Sharma, Kanuj, Kamm, Simon, Afansenko, Valentyna, Barón, Kevin Muñoz, Kallfass, Ingmar
Published in Procedia CIRP (2023)
Published in Procedia CIRP (2023)
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Journal Article
Simulation-to-Reality based Transfer Learning for the Failure Analysis of SiC Power Transistors
Kamm, Simon, Bickelhaupt, Sandra, Sharma, Kanuj, Jazdi, Nasser, Kallfass, Ingmar, Weyrich, Michael
Published in 2022 IEEE 27th International Conference on Emerging Technologies and Factory Automation (ETFA) (06.09.2022)
Published in 2022 IEEE 27th International Conference on Emerging Technologies and Factory Automation (ETFA) (06.09.2022)
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Conference Proceeding
Context-enriched modeling using Knowledge Graphs for intelligent Digital Twins of Production Systems
Muller, Timo, Sahlab, Nada, Kamm, Simon, Kohler, Christian, Braun, Dominik, Jazdi, Nasser, Weyrich, Michael
Published in 2022 IEEE 27th International Conference on Emerging Technologies and Factory Automation (ETFA) (06.09.2022)
Published in 2022 IEEE 27th International Conference on Emerging Technologies and Factory Automation (ETFA) (06.09.2022)
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Conference Proceeding
Knowledge Graphs as Enhancers of Intelligent Digital Twins
Sahlab, Nada, Kamm, Simon, Muller, Timo, Jazdi, Nasser, Weyrich, Michael
Published in 2021 4th IEEE International Conference on Industrial Cyber-Physical Systems (ICPS) (10.05.2021)
Published in 2021 4th IEEE International Conference on Industrial Cyber-Physical Systems (ICPS) (10.05.2021)
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Conference Proceeding
Hybrid Model of Power MOSFET for Soft Failures Estimation Based on Time Domain Reflectometry and Machine Learning
Afanasenko, Valentyna, Sharma, Kanuj, Kamm, Simon, Kallfass, Ingmar
Published in 2023 11th International Conference on Power Electronics and ECCE Asia (ICPE 2023 - ECCE Asia) (22.05.2023)
Published in 2023 11th International Conference on Power Electronics and ECCE Asia (ICPE 2023 - ECCE Asia) (22.05.2023)
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Conference Proceeding
Characterization of Online Junction Temperature of the SiC power MOSFET by Combination of Four TSEPs using Neural Network
Sharma, Kanuj, Kamm, Simon, Baron, Kevin Muaoz, Kallfass, Ingmar
Published in 2022 24th European Conference on Power Electronics and Applications (EPE'22 ECCE Europe) (05.09.2022)
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Published in 2022 24th European Conference on Power Electronics and Applications (EPE'22 ECCE Europe) (05.09.2022)
Conference Proceeding
A Hybrid Modelling Approach for Parameter Estimation of Analytical Reflection Models in the Failure Analysis Process of Semiconductors
Kamm, Simon, Sharma, Kanuj, Jazdi, Nasser, Weyrich, Michael
Published in 2021 IEEE 17th International Conference on Automation Science and Engineering (CASE) (23.08.2021)
Published in 2021 IEEE 17th International Conference on Automation Science and Engineering (CASE) (23.08.2021)
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Conference Proceeding
Hybrid Modelling for the Failure Analysis of SiC Power Transistors on Time-Domain Reflectometry Data
Kamm, Simon, Sharma, Kanuj, Kallfass, Ingmar, Jazdi, Nasser, Weyrich, Michael
Published in 2021 IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA) (15.09.2021)
Published in 2021 IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA) (15.09.2021)
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Conference Proceeding
Non-Destructive Failure Analysis of Power Devices via Time- Domain Reflectometry
Sharma, Kanuj, Kamm, Simon, Afanasenko, Valentyna, Munoz Baron, Kevin, Kallfass, Ingmar
Published in 2021 IEEE 17th International Conference on Automation Science and Engineering (CASE) (23.08.2021)
Published in 2021 IEEE 17th International Conference on Automation Science and Engineering (CASE) (23.08.2021)
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Conference Proceeding