Characterization of traps in the gate dielectric of amorphous and nanocrystalline silicon thin-film transistors by 1/f noise
Ioannidis, E. G., Tsormpatzoglou, A., Tassis, D. H., Dimitriadis, C. A., Templier, F., Kamarinos, G.
Published in Journal of applied physics (15.11.2010)
Published in Journal of applied physics (15.11.2010)
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Journal Article
On-current modeling of large-grain polycrystalline silicon thin-film transistors
Farmakis, F.V., Brini, J., Kamarinos, G., Angelis, C.T., Dimitriadis, C.A., Miyasaka, M.
Published in IEEE transactions on electron devices (01.04.2001)
Published in IEEE transactions on electron devices (01.04.2001)
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Journal Article
Stability of Amorphous-Silicon and Nanocrystalline Silicon Thin-Film Transistors Under DC and AC Stress
Hatzopoulos, A.T., Arpatzanis, N.., Tassis, D.H., Dimitriadis, C.A., Templier, F.., Oudwan, M.., Kamarinos, G..
Published in IEEE electron device letters (01.09.2007)
Published in IEEE electron device letters (01.09.2007)
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Journal Article
Effect of excimer laser annealing on the structural and electrical properties of polycrystalline silicon thin-film transistors
Angelis, C. T., Dimitriadis, C. A., Miyasaka, M., Farmakis, F. V., Kamarinos, G., Brini, J., Stoemenos, J.
Published in Journal of applied physics (15.10.1999)
Published in Journal of applied physics (15.10.1999)
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Journal Article
On-state drain current modeling of large-grain poly-Si TFTs based on carrier transport through latitudinal and longitudinal grain boundaries
Hatzopoulos, A.T., Tassis, D.H., Hastas, N.A., Dimitriadis, C.A., Kamarinos, G.
Published in IEEE transactions on electron devices (01.08.2005)
Published in IEEE transactions on electron devices (01.08.2005)
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Journal Article
Determination of bulk and interface density of states in polycrystalline silicon thin film transistors
Arpatzanis, N., Dimitriadis, C.A., Siskos, S., Hatzopoulos, A.A., Kamarinos, G.
Published in Thin solid films (16.07.2007)
Published in Thin solid films (16.07.2007)
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Journal Article
Conference Proceeding
Hysteresis effect in bottom-gate polymorphous silicon thin-film transistors
Hastas, N.A., Arpatzanis, N., Dimitriadis, C.A., Brochet, J., Templier, F., Kamarinos, G.
Published in Microelectronics and reliability (01.03.2011)
Published in Microelectronics and reliability (01.03.2011)
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Journal Article
Origin of low-frequency noise in polycrystalline silicon thin-film transistors
Dimitriadis, C. A., Farmakis, F. V., Kamarinos, G., Brini, J.
Published in Journal of applied physics (15.06.2002)
Published in Journal of applied physics (15.06.2002)
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Journal Article
An analytical hot-carrier induced degradation model in polysilicon TFTs
Hatzopoulos, A.T., Tassis, D.H., Hastas, N.A., Dimitriadis, C.A., Kamarinos, G.
Published in IEEE transactions on electron devices (01.10.2005)
Published in IEEE transactions on electron devices (01.10.2005)
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Journal Article
Effect of Channel Width on the Electrical Characteristics of Amorphous/Nanocrystalline Silicon Bilayer Thin-Film Transistors
Hatzopoulos, Argyrios T., Arpatzanis, Nikolaos, Tassis, Dimitrios H., Dimitriadis, Charalabos A., Templier, Franois, Oudwan, Maher, Kamarinos, George
Published in IEEE transactions on electron devices (01.05.2007)
Published in IEEE transactions on electron devices (01.05.2007)
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Journal Article
Study of the Drain Leakage Current in Bottom-Gated Nanocrystalline Silicon Thin-Film Transistors by Conduction and Low-Frequency Noise Measurements
Hatzopoulos, A.T., Arpatzanis, N., Tassis, D.H., Dimitriadis, C.A., Oudwan, M., Templier, F., Kamarinos, G.
Published in IEEE transactions on electron devices (01.05.2007)
Published in IEEE transactions on electron devices (01.05.2007)
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Journal Article
Study of leakage current in n-channel and p-channel polycrystalline silicon thin-film transistors by conduction and low frequency noise measurements
Angelis, C. T., Dimitriadis, C. A., Samaras, I., Brini, J., Kamarinos, G., Gueorguiev, V. K., Ivanov, Tz. E.
Published in Journal of applied physics (15.10.1997)
Published in Journal of applied physics (15.10.1997)
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Journal Article
Effect of Channel Width Shortening on the Stability of a-Si:H/nc-Si:H Bilayer Thin-Film Transistors
Pappas, I., Dimitriadis, C.A., Siskos, S., Templier, F., Oudwan, M., Kamarinos, G.
Published in IEEE electron device letters (01.08.2008)
Published in IEEE electron device letters (01.08.2008)
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Journal Article
Effect of interface roughness on gate bias instability of polycrystalline silicon thin-film transistors
Hastas, N. A., Dimitriadis, C. A., Kamarinos, G.
Published in Journal of applied physics (15.10.2002)
Published in Journal of applied physics (15.10.2002)
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Journal Article