Key-Value Pair Searhing System via Tesseract OCR and Post Processing
Kalo, Aron Zoltan, Sipos, Miklos Laszlo
Published in 2021 IEEE 19th World Symposium on Applied Machine Intelligence and Informatics (SAMI) (21.01.2021)
Published in 2021 IEEE 19th World Symposium on Applied Machine Intelligence and Informatics (SAMI) (21.01.2021)
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