by ARBABI, F, KALANTARIAN, A, ABOUATALLAH, R, WANG, R, WALLACE, J. S, BAZYLAK, A
Published in Journal of power sources (15.07.2014)

by Privitera, S., Bersuker, G., Butcher, B., Kalantarian, A., Lombardo, S., Bongiorno, C., Geer, R., Gilmer, D.C., Kirsch, P.D.
Published in Microelectronic engineering (01.09.2013)

by Hosseini, M. S., Iraji zad, A., Vossoughi, M., Kalantarian, A.
Published in Journal of materials science. Materials in electronics (01.10.2020)

by Kalantarian, A, David, R, Neumann, A. W
Published in Langmuir (15.12.2009)

by Kalantarian, A, David, R, Chen, J, Neumann, A. W
Published in Langmuir (05.04.2011)

by Arbabi, Faraz, Kalantarian, Ali, Abouatallah, Rami, Wang, Rainey, Wallace, James, Bazylak, Aimy
Published in ECS transactions (01.01.2013)

by Butcher, B., Bersuker, G., Vandelli, L., Padovani, A., Larcher, L., Kalantarian, A., Geer, R., Gilmer, D. C.
Published in 2013 5th IEEE International Memory Workshop (01.05.2013)

by Butcher, B., Bersuker, G., Young-Fisher, K. G., Gilmer, D. C., Kalantarian, A., Nishi, Y., Geer, R., Kirsch, P. D., Jammy, R.
Published in 2012 4th IEEE International Memory Workshop (01.05.2012)

by KALANTARIAN, A, DAVID, R, NEUMANN, A. W
Published in Langmuir (2009)

by Kalantarian, A., Bersuker, G., Butcher, B., Gilmer, D. C., Privitera, S., Lombardo, S., Geer, R., Nishi, Y., Kirsch, P., Jammy, R.
Published in 2013 International Symposium on VLSI Technology, Systems and Application (VLSI-TSA) (01.04.2013)

by Kalantarian, A., Bersuker, G., Gilmer, D. C., Veksler, D., Butcher, B., Padovani, A., Pirrotta, O., Larcher, L., Geer, R., Nishi, Y., Kirsch, P.
Published in 2012 IEEE International Reliability Physics Symposium (IRPS) (01.04.2012)

by Privitera, S, Bersuker, G, Butcher, B, Kalantarian, A, Lombardo, S, Bongiorno, C, Geer, R, Gilmer, D C, Kirsch, P D
Published in Microelectronic engineering (01.09.2013)

by Kalantarian, A. H., Mayilyan, G. L., Gladun, A. D., Vardanian, R. A.
Published in Philosophical magazine. A, Physics of condensed matter. Defects and mechanical properties (01.08.1997)

by PRIVITERA, S, BERSUKER, G, BUTCHER, B, KALANTARIAN, A, LOMBARDO, S, BONGIORNO, C, GEER, R, GILMER, D. C, KIRSCH, P. D
Published in Microelectronic engineering (2013)

by Gilmer, D. C., Koveshnikov, S., Butcher, B., Bersuker, G., Kalantarian, A., Sung, M., Geer, R., Nishi, Y., Kirsch, P., Jammy, R.
Published in Proceedings of Technical Program of 2012 VLSI Technology, System and Application (01.04.2012)

by Butcher, B., Koveshnikov, S., Gilmer, D. C., Bersuker, G., Sung, M. G., Kalantarian, A., Park, C., Geer, R., Nishi, Y., Kirsch, P. D., Jammy, R.
Published in 2011 IEEE International Integrated Reliability Workshop Final Report (01.10.2011)

by Gilmer, D. C., Bersuker, G., Koveshnikov, S., Jo, M., Kalantarian, A., Butcher, B., Geer, R., Nishi, Y., Kirsch, P. D., Jammy, R.
Published in 2012 4th IEEE International Memory Workshop (01.05.2012)

by Nanju Na, Bailey, M., Kalantarian, A.
Published in 2007 IEEE Electrical Performance of Electronic Packaging (01.10.2007)