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Frequency-dependent physical parameters, the voltage-dependent profile of surface traps, and their lifetime of Au/(ZnCdS-GO:PVP)/n-Si structures by using the conductance method

by Güçlü, Ç. Ş., Tanrıkulu, E. Erbilen, Ulusoy, M., Kalandargh, Y. Azizian, Altındal, Ş.
Published in Journal of materials science. Materials in electronics (01.02.2024)

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Frequency-dependent physical parameters, the voltage-dependent profile of surface traps, and their lifetime of Au/(ZnCdS-GO:PVP)/n-Si structures by using the conductance method

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