Charge Quantity Influence on Resistance Switching Characteristic During Forming Process
Tian-Jian Chu, Ting-Chang Chang, Tsung-Ming Tsai, Hsing-Hua Wu, Jung-Hui Chen, Kuan-Chang Chang, Tai-Fa Young, Kai-Hsang Chen, Yong-En Syu, Geng-Wei Chang, Yao-Feng Chang, Min-Chen Chen, Jyun-Hao Lou, Jhih-Hong Pan, Jian-Yu Chen, Ya-Hsiang Tai, Cong Ye, Hao Wang, Sze, Simon M.
Published in IEEE electron device letters (01.04.2013)
Published in IEEE electron device letters (01.04.2013)
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