Investigation of the spatial resolution of the light-addressable potentiometric sensor
George, M., Parak, W.J., Gerhardt, I., Moritz, W., Kaesen, F., Geiger, H., Eisele, I., Gaub, H.E.
Published in Sensors and actuators. A. Physical. (15.11.2000)
Published in Sensors and actuators. A. Physical. (15.11.2000)
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Journal Article
Electric field tailoring in MBE-grown vertical sub-100 nm MOSFETs
Hansch, W, Rao, V.Ramgopal, Fink, C, Kaesen, F, Eisele, I
Published in Thin solid films (26.05.1998)
Published in Thin solid films (26.05.1998)
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Journal Article
Conference Proceeding
Enhancement of device performance in vertical sub-100 nm MOS devices due to local channel doping
Fink, C., Anil, K.G., Geiger, H., Hansch, W., Kaesen, F., Schulze, J., Sulima, T., Eisele, I.
Published in Solid-state electronics (01.03.2002)
Published in Solid-state electronics (01.03.2002)
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Journal Article
Etching characteristics of Si and SiO2 with a low energy argon/hydrogen d.c. plasma source
STRASS, A, HANSCH, W, BIERINGER, P, NEUBECKER, A, KAESEN, F, FISCHER, A, EISELE, I
Published in Surface & coatings technology (01.12.1997)
Published in Surface & coatings technology (01.12.1997)
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Conference Proceeding
Journal Article
Optimization of the channel doping profile of vertical sub-100 nm MOSFETs
Kaesen, F, Fink, C, Anil, K.G, Hansch, W, Doll, T, Grabolla, T, Schreiber, H, Eisele, I
Published in Thin solid films (30.12.1998)
Published in Thin solid films (30.12.1998)
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Journal Article
Conference Proceeding
Low temperature electrical surface passivation of MBE-grown pin diodes by hydrogen and oxygen plasma processes
Strass, A, Hansch, W, Kaesen, F, Fehlauer, G, Bieringer, P, Fischer, A, Eisele, I
Published in Thin solid films (26.05.1998)
Published in Thin solid films (26.05.1998)
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Journal Article
Conference Proceeding
Defect-free strain relaxation in locally MBE-grown SiGe heterostructures
Rupp, T, Kaesen, F, Hansch, W, Hammerl, E, Gravesteijn, D.J, Schorer, R, Silveira, E, Abstreiter, G, Eisele, I
Published in Thin solid films (15.02.1997)
Published in Thin solid films (15.02.1997)
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Journal Article
Influence of fluorine contamination on semiconductor wafer probing
Reinl, M., Stimpel-Lindner, T., Sulima, T., Eisele, I., Nagler, O., Kaesen, F.
Published in 2008 26th International Conference on Microelectronics (01.05.2008)
Published in 2008 26th International Conference on Microelectronics (01.05.2008)
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Conference Proceeding
Quantum oscillation of the cyclotron mass in two-dimensional electron systems in silicon
Kaesen, KF, Huber, A, Lorenz, H, Kotthaus, JP, Bakker, S, Klapwijk, TM
Published in Physical review. B, Condensed matter (15.07.1996)
Published in Physical review. B, Condensed matter (15.07.1996)
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Journal Article
Channel Engineering for the Reduction of Random-Dopant Placement-Induced Threshold Voltage Fluctuations in Vertical sub-100nm MOSFETs
Hansch, W., Anil, K., Bieringer, P., Fink, C., Kaesen, F., Eisele, I., Tanaka, M., Miura-Mattausch, M.
Published in 29th European Solid-State Device Research Conference (1999)
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Published in 29th European Solid-State Device Research Conference (1999)
Conference Proceeding