Low-Frequency Noise After Channel Soft Oxide Breakdown in HfLaSiO Gate Dielectric
Hyun-Sik Choi, Seung-Ho Hong, Rock-Hyun Baek, Kyong-Taek Lee, Chang-Yong Kang, Jammy, R., Byoung-Hun Lee, Sung-Woo Jung, Yoon-Ha Jeong
Published in IEEE electron device letters (01.05.2009)
Published in IEEE electron device letters (01.05.2009)
Get full text
Journal Article
Technology scaling on High-K & Metal-Gate FinFET BTI reliability
Kyong Taek Lee, Wonchang Kang, Eun-Ae Chung, Gunrae Kim, Hyewon Shim, Hyunwoo Lee, Hyejin Kim, Minhyeok Choe, Nae-In Lee, Patel, Anuj, Junekyun Park, Jongwoo Park
Published in 2013 IEEE International Reliability Physics Symposium (IRPS) (01.04.2013)
Published in 2013 IEEE International Reliability Physics Symposium (IRPS) (01.04.2013)
Get full text
Conference Proceeding
Extraction of Effective Mobility from nMOSFETs With Leaky Gate Dielectric Using Time Domain Reflectometry
Yonghun Kim, Young Gon Lee, Ukjin Jung, Jin Ju Kim, Minhyeok Choe, Kyong Taek Lee, Sangwoo Pae, Jongwoo Park, Byoung Hun Lee
Published in IEEE transactions on electron devices (01.04.2015)
Published in IEEE transactions on electron devices (01.04.2015)
Get full text
Journal Article
PBTI-Associated High-Temperature Hot Carrier Degradation of nMOSFETs With Metal-Gate/High- k Dielectrics
Kyong Taek Lee, Chang Yong Kang, Ook Sang Yoo, Rino Choi, Byoung Hun Lee, Lee, J.C., Hi-Deok Lee, Yoon-Ha Jeong
Published in IEEE electron device letters (01.04.2008)
Published in IEEE electron device letters (01.04.2008)
Get full text
Journal Article
RF and hot carrier effects in metal gate/high-k dielectric nMOSFETs at cryogenic temperature
Hyun Chul Sagong, Kyong Taek Lee, Seung-Ho Hong, Hyun-Sik Choi, Gil-Bok Choi, Rock-Hyun Baek, Seung-Hyun Song, Min-Sang Park, Jae Chul Kim, Yoon-Ha Jeong, Sung-Woo Jung, Chang Yong Kang
Published in 2009 IEEE International Reliability Physics Symposium (01.04.2009)
Published in 2009 IEEE International Reliability Physics Symposium (01.04.2009)
Get full text
Conference Proceeding
Interfacial-Layer-Driven Dielectric Degradation and Breakdown of HfSiON/SiON Gate Dielectric nMOSFETs
CHOI, Do-Young, KYONG TAEK LEE, BAEK, Chang-Ki, CHANG WOO SOHN, HYUN CHUL SAGONG, JUNG, Eui-Young, LEE, Jeong-Soo, JEONG, Yoon-Ha
Published in IEEE electron device letters (01.10.2011)
Published in IEEE electron device letters (01.10.2011)
Get full text
Journal Article
Reliability of HFO2/SIO2 dielectric with strain engineering using CESL stressor
Jae Chul Kim, Kyong Taek Lee, Seung Hyun Song, Min Sang Park, Seung Ho Hong, Gil Bok Choi, Hyun Sik Choi, Rock Hyun Baek, Hyun Chul Sagong, Yoon-Ha Jeong, Sung Woo Jung, Chang Young Kang
Published in 2009 IEEE International Reliability Physics Symposium (01.04.2009)
Published in 2009 IEEE International Reliability Physics Symposium (01.04.2009)
Get full text
Conference Proceeding
New observations on the random telegraph noise induced Vth variation in nano-scale MOSFETs
Changze Liu, Kyong Taek Lee, Hyunwoo Lee, Yoohwan Kim, Sangwoo Pae, Jongwoo Park
Published in 2014 IEEE International Reliability Physics Symposium (01.06.2014)
Published in 2014 IEEE International Reliability Physics Symposium (01.06.2014)
Get full text
Conference Proceeding
Reliability study of methods to suppress boron transient enhanced diffusion in high-k/metal gate Si/SiGe channel pMOSFETs
Park, Min Sang, Kim, Yonghyun, Lee, Kyong Taek, Kang, Chang Yong, Min, Byoung-Gi, Oh, Jungwoo, Majhi, Prashant, Tseng, Hsing-Huang, Lee, Jack C., Banerjee, Sanjay K., Lee, Jeong-Soo, Jammy, Raj, Jeong, Yoon-Ha
Published in Microelectronic engineering (01.12.2013)
Published in Microelectronic engineering (01.12.2013)
Get full text
Journal Article
A Study of Strain Engineering Using CESL Stressor on Reliability Comparing Effect of Intrinsic Mechanical Stress
Kyong Taek Lee, Chang Yong Kang, Min-Sang Park, Byoung Hun Lee, Ho Kyung Park, Hyun Sang Hwang, Hsing-Huang Tseng, Jammy, R., Yoon-Ha Jeong
Published in IEEE electron device letters (01.07.2009)
Published in IEEE electron device letters (01.07.2009)
Get full text
Journal Article
Frequency dependent TDDB behaviors and its reliability qualification in 32nm high-k/metal gate CMOSFETs
Kyong Taek Lee, Jongik Nam, Minjung Jin, Kidan Bae, Junekyun Park, Lira Hwang, Jungin Kim, Hyunjin Kim, Jongwoo Park
Published in 2011 International Reliability Physics Symposium (01.04.2011)
Published in 2011 International Reliability Physics Symposium (01.04.2011)
Get full text
Conference Proceeding
A comparative study of depth profiling of interface states using charge pumping and low frequency noise measurement in SiO2/HfO2 gate stack nMOSFETs
KYONG TAEK LEE, CHANG YONG KANG, BYOUNG HUN LEE, BERSUKER, Gennadi, TSENG, Hsing-Huang, JAMMY, Raj, JEONG, Yoon-Ha, CHOI, Hyun-Sik, HONG, Seung-Ho, CHOI, Gil-Bok, JAE CHUL KIM, SONG, Seung-Hyun, BAEK, Rock-Hyun, PARK, Min-Sang, HYUN CHUL SAGONG
Published in Microelectronic engineering (01.12.2011)
Published in Microelectronic engineering (01.12.2011)
Get full text
Conference Proceeding
Journal Article
Gate stack process optimization for TDDB improvement in 28nm high-k/metal gate nMOSFETs
Kyong Taek Lee, Hyunjin Kim, Junekyun Park, Jongwoo Park
Published in 2012 IEEE International Reliability Physics Symposium (IRPS) (01.04.2012)
Published in 2012 IEEE International Reliability Physics Symposium (IRPS) (01.04.2012)
Get full text
Conference Proceeding
The Effect of a Si Capping Layer on RF Characteristics of High- k /Metal Gate SiGe Channel pMOSFETs
Min Sang Park, Kyong Taek Lee, Chang Yong Kang, Gil-Bok Choi, Hyun Chul Sagong, Chang Woo Sohn, Byoung-Gi Min, Jungwoo Oh, Majhi, Prashant, Hsing-Huang Tseng, Lee, Jack C, Jeong-Soo Lee, Jammy, Raj, Yoon-Ha Jeong
Published in IEEE electron device letters (01.10.2010)
Published in IEEE electron device letters (01.10.2010)
Get full text
Journal Article
Effect of Si capping layer on the interface quality and NBTI of high mobility channel Ge-on-Si pMOSFETs
Yoo, Ook Sang, Oh, Jungwoo, Min, Kyung Seok, Kang, Chang Yong, Lee, B.H., Lee, Kyong Taek, Na, Min Ki, Kwon, Hyuk-Min, Majhi, P., Tseng, H-H, Jammy, Raj, Wang, J.S., Lee, Hi-Deok
Published in Microelectronic engineering (01.03.2009)
Published in Microelectronic engineering (01.03.2009)
Get full text
Journal Article
Conference Proceeding
Effects of In Situ O2 Plasma Treatment on OFF-State Leakage and Reliability in Metal-Gate/High-k Dielectric MOSFETs
KYONG TAEK LEE, CHANG YONG KANG, JEONG, Yoon-Ha, BYUNG SUN JU, CHOI, Rino, KYUNG SEOK MIN, OOK SANG YOO, BYOUNG HUN LEE, JAMMY, Raj, LEE, Jack C, LEE, Hi-Deok
Published in IEEE electron device letters (01.06.2008)
Published in IEEE electron device letters (01.06.2008)
Get full text
Journal Article
RF performance degradation in 100-nm metal gate/high-k dielectric nMOSFET by hot carrier effects
Hyun Chul Sagong, Kyong Taek Lee, Chang Yong Kang, Gil-Bok Choi, Hyun-Sik Choi, Rock-Hyun Baeka, Min-Sang Park, Sung-Woo Jung, Yoon-Ha Jeong
Published in 2009 Proceedings of the European Solid State Device Research Conference (01.09.2009)
Published in 2009 Proceedings of the European Solid State Device Research Conference (01.09.2009)
Get full text
Conference Proceeding
New observations on hot carrier induced dynamic variation in nano-scaled SiON/poly, HK/MG and FinFET devices based on on-the-fly HCI technique: The role of single trap induced degradation
Changze Liu, Kyong Taek Lee, Sangwoo Pae, Jongwoo Park
Published in 2014 IEEE International Electron Devices Meeting (01.12.2014)
Published in 2014 IEEE International Electron Devices Meeting (01.12.2014)
Get full text
Conference Proceeding
A comparative study of reliability and performance of strain engineering using CESL stressor and mechanical strain
Kyong Taek Lee, Chang Yong Kang, Ook Sang Yoo, Chadwin, D., Bersuker, G., Ho Kyung Park, Jun Myung Lee, Hyung Sang Hwang, Byoung Hun Lee, Hi-Deok Lee, Yoon-Ha Jeong
Published in 2008 IEEE International Reliability Physics Symposium (01.04.2008)
Published in 2008 IEEE International Reliability Physics Symposium (01.04.2008)
Get full text
Conference Proceeding
Test Structures for Accurate UHF C-V Measurements of Nano-Scale CMOSFETs with HfSiON and TiN Metal Gate
Kyong-Taek Lee, Schmitz, J., Brown, G.A., Dawei Heh, Rino Choi, Harris, R., Seung-Chul Song, Byoung Hun Lee, In-Shik Han, Hi-Deok Lee, Yoon-Ha Jeong
Published in 2007 IEEE International Conference on Microelectronic Test Structures (01.03.2007)
Published in 2007 IEEE International Conference on Microelectronic Test Structures (01.03.2007)
Get full text
Conference Proceeding