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Year of Publication 24.03.2023
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Probe card test apparatus comprising the probe card testing method for testing and manufacturing semiconductor using the probe card
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EQUIPMENT FOR GENERATING ELECTRICITY USING A DRIVING FORCE OF ROAD VEHICLE
SHON, WOONG HEE, KIM, MIN CHUR, KIM, KUE WON, PARK, KYOUNG YONG, HWANG, JUNG KU, KIM, MIN SUN, KWAG, DONG GI, KWON, DONG UK
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Year of Publication 08.06.2015
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SEMICONDUCTOR PACKAGE AND METHOD OF FABRICATING THE SAME
KIM, SUN CHUL, LEE, JU HYUNG, KIM, YONG HYUN, KWON, DONG UK, LEE, MIN JAE
Year of Publication 16.03.2023
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Year of Publication 16.03.2023
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