Channel-Stacked NAND Flash Memory With Tied Bit-Line and Ground Select Transistor
Kwon, Dae Woong, Seo, Joo Yun, Park, Se Hwan, Kim, Wandong, Kim, Do-Bin, Lee, Sang-Ho, Cho, Gyu Seong, Park, Sung-Kye, Park, Byung-Gook
Published in IEEE electron device letters (01.11.2016)
Published in IEEE electron device letters (01.11.2016)
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Journal Article
Light Effect on Negative Bias-Induced Instability of HfInZnO Amorphous Oxide Thin-Film Transistor
Kwon, Dae Woong, Kim, Jang Hyun, Chang, Ji Soo, Kim, Sang Wan, Kim, Wandong, Park, Jae Chul, Kim, Chang Jung, Park, Byung-Gook
Published in IEEE transactions on electron devices (01.04.2011)
Published in IEEE transactions on electron devices (01.04.2011)
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Journal Article
Investigation of drift effect on silicon nanowire field effect transistor based pH sensor
Kim, Sihyun, Kwon, Dae Woong, Lee, Ryoongbin, Kim, Dae Hwan, Park, Byung-Gook
Published in Japanese Journal of Applied Physics (01.06.2016)
Published in Japanese Journal of Applied Physics (01.06.2016)
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Journal Article
Investigation of Feasibility of Tunneling Field Effect Transistor (TFET) as Highly Sensitive and Multi-sensing Biosensors
Lee, Ryoongbin, Kwon, Dae Woong, Kim, Sihyun, Kim, Dae Hwan, Park, Byung-Gook
Published in Journal of semiconductor technology and science (01.02.2017)
Published in Journal of semiconductor technology and science (01.02.2017)
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Journal Article
Analysis on temperature dependent current mechanism of tunnel field-effect transistors
Lee, Junil, Kwon, Dae Woong, Kim, Hyun Woo, Kim, Jang Hyun, Park, Euyhwan, Park, Taehyung, Kim, Sihyun, Lee, Ryoongbin, Lee, Jong-Ho, Park, Byung-Gook
Published in Japanese Journal of Applied Physics (01.06.2016)
Published in Japanese Journal of Applied Physics (01.06.2016)
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Journal Article
Novel Boosting Scheme Using Asymmetric Pass Voltage for Reducing Program Disturbance in 3-Dimensional NAND Flash Memory
Kwon, Dae Woong, Lee, Junil, Kim, Sihyun, Lee, Ryoongbin, Kim, Sangwan, Lee, Jong-Ho, Park, Byung-Gook
Published in IEEE journal of the Electron Devices Society (01.01.2018)
Published in IEEE journal of the Electron Devices Society (01.01.2018)
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Journal Article
Characterization of the Vertical Position of the Trapped Charge in Charge-trap Flash Memory
Seunghyun Kim, Dae Woong Kwon, Sang-Ho Lee, Sang-Ku Park, Youngmin Kim, Hyungmin Kim, Young Goan Kim, Seongjae Cho, Byung-Gook Park
Published in Journal of semiconductor technology and science (01.04.2017)
Published in Journal of semiconductor technology and science (01.04.2017)
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Journal Article
Clinical outcomes and considerations of the lumbar interbody fusion technique for lumbar disk disease in adolescents
Kwon, Dae-Woong, Kim, Kyung-Hyun, Park, Jeong-Yoon, Chin, Dong-Kyu, Kim, Keun-Su, Cho, Young-Eun, Kuh, Sung-Uk
Published in Child's nervous system (01.08.2013)
Published in Child's nervous system (01.08.2013)
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Journal Article
Split-gate-structure 1T DRAM for retention characteristic improvement
Kim, Garam, Kim, Sang Wan, Ryoo, Kyung-Chang, Oh, Jeong-Hoon, Sun, Min-Chul, Kim, Hyun Woo, Kwon, Dae Woong, Jang, Ji Soo, Jung, Sunghun, Kim, Jang Hyun, Park, Byung-Gook
Published in Journal of nanoscience and nanotechnology (01.07.2011)
Published in Journal of nanoscience and nanotechnology (01.07.2011)
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Journal Article
Investigation of Threshold Voltage Disturbance Caused by Programmed Adjacent Cell in Virtual Source/Drain NAND Flash Memory
Kim, Wandong, Kwon, Dae Woong, Ji, Jung Hwan, Lee, Jung Hoon, Lee, Jong-Ho, Shin, Hyungcheol, Park, Byung-Gook
Published in Japanese Journal of Applied Physics (01.04.2011)
Published in Japanese Journal of Applied Physics (01.04.2011)
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Journal Article
Investigation of Threshold Voltage Disturbance Caused by Programmed Adjacent Cell in Virtual Source/Drain NAND Flash Memory
Kim, Wandong, Kwon, Dae Woong, Ji, Jung Hwan, Lee, Jung Hoon, Lee, Jong-Ho, Shin, Hyungcheol, Park, Byung-Gook
Published in Japanese Journal of Applied Physics (01.04.2011)
Published in Japanese Journal of Applied Physics (01.04.2011)
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Journal Article