In0.53Ga0.47As-Based nMOSFET Design for Low Standby Power Applications
Bhuwalka, Krishna K., Zhenhua Wu, Hyeon-Kyun Noh, Wonsok Lee, Cantoro, Mirco, Yeon-Cheol Heo, Seonghoon Jin, Woosung Choi, Uihui Kwon, Maeda, Shigenobu, Keun-Ho Lee, Young-Kwan Park
Published in IEEE transactions on electron devices (01.09.2015)
Published in IEEE transactions on electron devices (01.09.2015)
Get full text
Journal Article
Investigation of HCI reliability in interdigitated LDMOS
Kyuheon Cho, Seonghoon Ko, Machida, Fumie, Jaeho Kim, Jaejune Jang, Uihui Kwon, Keun-Ho Lee, Youngkwan Park
Published in 2015 IEEE 27th International Symposium on Power Semiconductor Devices & IC's (ISPSD) (01.05.2015)
Published in 2015 IEEE 27th International Symposium on Power Semiconductor Devices & IC's (ISPSD) (01.05.2015)
Get full text
Conference Proceeding
Layout-induced stress effects on the performance and variation of FinFETs
Lee, Choongmok, Kang, Hyun-Chul, Min, Jeong Guk, Kim, Jongchol, Kwon, Uihui, Lee, Keun-Ho, Park, Youngkwan
Published in 2015 International Conference on Simulation of Semiconductor Processes and Devices (SISPAD) (01.09.2015)
Published in 2015 International Conference on Simulation of Semiconductor Processes and Devices (SISPAD) (01.09.2015)
Get full text
Conference Proceeding
Journal Article
Surface scattering impact on Si/TiSi2 contact resistance
Vuttivorakulchai, Kantawong, Pourghaderi, Mohammad Ali, Kim, Gwang-Jun, Song, Seunghyun, Kim, Yoon-Suk, Kwon, Uihui, Kim, Dae Sin
Published in Solid-state electronics (01.03.2023)
Published in Solid-state electronics (01.03.2023)
Get full text
Journal Article
Optimization of Photodiode Design Through Analysis of Full-Well Capacity and Image Lag in 0.5 μm CMOS Image Sensors With Vertical Transfer Gates
Park, Jae Hyeon, Suk, Chan Hee, Kim, Sungchul, Kim, Jae Ho, Kwon, Uihui, Kim, Dae Sin, Yoo, Keon-Ho, Kim, Tae Whan
Published in IEEE electron device letters (01.10.2022)
Published in IEEE electron device letters (01.10.2022)
Get full text
Journal Article
Analysis and Optimization of an Analog MOSFET with a Slit Well at Channel Center Towards Higher Output Resistance
Fujii, Hiroki, Yoo, Jaehyun, Jeong, Dawon, Min, Seongsik, Kim, Myoungsoo, Kwon, Uihui, Kim, Dae Sin
Published in ESSDERC 2022 - IEEE 52nd European Solid-State Device Research Conference (ESSDERC) (19.09.2022)
Published in ESSDERC 2022 - IEEE 52nd European Solid-State Device Research Conference (ESSDERC) (19.09.2022)
Get full text
Conference Proceeding
Critical Backscattering Length in Nanotransistors
Pourghaderi, M. Ali, Pham, Anh-Tuan, Park, Hong-Hyun, Jin, Seonghoon, Vuttivorakulchai, Kantawong, Park, Yonghee, Kwon, Uihui, Choi, Woosung, Kim, Dae Sin
Published in IEEE electron device letters (01.02.2022)
Published in IEEE electron device letters (01.02.2022)
Get full text
Journal Article
TCAD challenges and opportunities to find a feasible device architecture for sub-3nm scaling
Kwon, Uihui, Park, Yonghee, Kim, Yoon-Suk, Yoo, Jaehyun, Kim, Dae Sin
Published in 2021 International Conference on Simulation of Semiconductor Processes and Devices (SISPAD) (27.09.2021)
Published in 2021 International Conference on Simulation of Semiconductor Processes and Devices (SISPAD) (27.09.2021)
Get full text
Conference Proceeding
Potential Engineering to Enhance Transfer Characteristics of Advanced CIS Pixel based on VTG - FDTI scheme
Kim, Sungchul, Kim, Jae Ho, Kwon, UiHui, Lee, Kyungho, Kim, Dae Sin
Published in 2021 International Conference on Simulation of Semiconductor Processes and Devices (SISPAD) (27.09.2021)
Published in 2021 International Conference on Simulation of Semiconductor Processes and Devices (SISPAD) (27.09.2021)
Get full text
Conference Proceeding
A practical Si nanowire technology with nanowire-on-insulator structure for beyond 10nm logic technologies
Hur, Sung-Gi, Yang, Jung-Gil, Kim, Sang-Su, Lee, Dong-Kyu, An, Taehyun, Nam, Kab-Jin, Kim, Seong-Je, Wu, Zhenhua, Lee, Wonsok, Kwon, Uihui, Lee, Keun-Ho, Park, Youngkwan, Yang, Wouns, Choi, Jungdal, Kang, Ho-Kyu, Jung, EunSung
Published in 2013 IEEE International Electron Devices Meeting (01.12.2013)
Published in 2013 IEEE International Electron Devices Meeting (01.12.2013)
Get full text
Conference Proceeding
Journal Article
Ballisticity Saturation by Unscalable Reflections
Pourghaderi, M. Ali, Ilatikhameneh, Hesameddin, Pham, Anh-Tuan, Park, Hong-Hyun, Lim, Jinyoung, Jiang, Zhengping, Wang, Jing, Jin, Seonghoon, Kim, Jongchol, Kwon, Uihui, Chung, Won-Young, Choi, Woosung, Kim, Dae Sin
Published in IEEE electron device letters (01.07.2020)
Published in IEEE electron device letters (01.07.2020)
Get full text
Journal Article
Gummel-cycle Algebraic Multigrid Preconditioning for Large-scale Device Simulations
Koshimoto, Hiroo, Ishimabushi, Hisashi, Yoo, Jaehyun, Kayama, Yasuyuki, Yamada, Satoru, Kwon, Uihui, Kim, Dae Sin
Published in 2020 International Conference on Simulation of Semiconductor Processes and Devices (SISPAD) (23.09.2020)
Published in 2020 International Conference on Simulation of Semiconductor Processes and Devices (SISPAD) (23.09.2020)
Get full text
Conference Proceeding
Considerations for DD Simulation at Cryogenic Temperature
Jin, Seonghoon, Pham, Anh-Tuan, Choi, Woosung, Pourghaderi, Mohammad Ali, Kwon, Uihui, Kim, Dae Sin
Published in 2021 International Conference on Simulation of Semiconductor Processes and Devices (SISPAD) (27.09.2021)
Published in 2021 International Conference on Simulation of Semiconductor Processes and Devices (SISPAD) (27.09.2021)
Get full text
Conference Proceeding
Machine-Learning based TCAD Optimization Method for Next Generation BCD Process Development
Yoo, Jaehyun, Jeon, Yongwoo, Jung, Dawon, Kim, Junhyuk, Ryu, Jisu, Kwon, UiHui, Kim, Dae Sin, Kim, Kwangtae, Kim, Yongdon, Lee, Kyuok, Jung, Jeahyun, kwon, Ohkyum
Published in 2021 33rd International Symposium on Power Semiconductor Devices and ICs (ISPSD) (30.05.2021)
Published in 2021 33rd International Symposium on Power Semiconductor Devices and ICs (ISPSD) (30.05.2021)
Get full text
Conference Proceeding