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Determination of Flow Pattern Defect Area by µ-Photoconductivity Decay Lifetime Measurement
Lee, Bo-Young, Hwang, Don-Ha, Kwon, Oh-Jong
Published in Japanese Journal of Applied Physics (01.08.1998)
Published in Japanese Journal of Applied Physics (01.08.1998)
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FRICTION RESISTANCE REDUCING DEVICE AND SHIP INCLUDING THE SAME
KIM BOO KI, LEE DONG YEON, KWON JONG OH, LEE JAE DOO, JANG JIN HO, KIM SANG MIN, CHOI SUNG HO, KIM HEE TAEK
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Year of Publication 27.08.2020
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