Reducing the contact time of a bouncing drop
BIRD, James C, DHIMAN, Rajeev, KWON, Hyuk-Min, VARANASI, Kripa K
Published in Nature (London) (21.11.2013)
Published in Nature (London) (21.11.2013)
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Hydrophobicity of rare-earth oxide ceramics
Azimi, Gisele, Dhiman, Rajeev, Kwon, Hyuk-Min, Paxson, Adam T, Varanasi, Kripa K
Published in Nature materials (01.04.2013)
Published in Nature materials (01.04.2013)
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Zinc oxide and indium-gallium-zinc-oxide bi-layer synaptic device with highly linear long-term potentiation and depression characteristics
Choi, Hyun-Woong, Song, Ki-Woo, Kim, Seong-Hyun, Nguyen, Kim Thanh, Eadi, Sunil Babu, Kwon, Hyuk-Min, Lee, Hi-Deok
Published in Scientific reports (24.01.2022)
Published in Scientific reports (24.01.2022)
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Comparison of Structural Integrity and Functional Outcome Between Delaminated and Nondelaminated Rotator Cuff Tears After En Masse Arthroscopic Repair: A Retrospective Cohort Study With Propensity Score Matching
Kim, Young-Kyu, Jung, Kyu-Hak, Kwon, Hyuk-Min
Published in The American journal of sports medicine (01.05.2019)
Published in The American journal of sports medicine (01.05.2019)
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Effects of thermal annealing on analog resistive switching behavior in bilayer HfO2/ZnO synaptic devices: the role of ZnO grain boundaries
Yeong-Jin, An, Han, Yan, Chae-min Yeom, Jun-kyo Jeong, Sunil Babu Eadi, Lee, Hi-Deok, Hyuk-Min Kwon
Published in Nanoscale (29.02.2024)
Published in Nanoscale (29.02.2024)
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Effect of high-pressure D2 and H2 annealing on LFN properties in FD-SOI pTFET
Shin, Hyun-Jin, Eadi, Sunil Babu, An, Yeong-Jin, Ryu, Tae-Gyu, Kim, Do-woo, Lee, Hi-Deok, Kwon, Hyuk-Min
Published in Scientific reports (02.11.2022)
Published in Scientific reports (02.11.2022)
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Explicit Thermal Resistance Model of Self-Heating Effects of AlGaN/GaN HEMTs with Linear and Non-Linear Thermal Conductivity
Chakraborty, Surajit, Amir, Walid, Shin, Ju-Won, Shin, Ki-Yong, Cho, Chu-Young, Kim, Jae-Moo, Hoshi, Takuya, Tsutsumi, Takuya, Sugiyama, Hiroki, Matsuzaki, Hideaki, Kwon, Hyuk-Min, Kim, Dae-Hyun, Kim, Tae-Woo
Published in Materials (25.11.2022)
Published in Materials (25.11.2022)
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Effect of Trap Behavior on the Reliability Instability of Metamorphic Buffer in InAlAs/InGaAs MHEMT on GaAs
Shin, Ki-Yong, Shin, Ju-Won, Amir, Walid, Chakraborty, Surajit, Shim, Jae-Phil, Lee, Sang-Tae, Jang, Hyunchul, Shin, Chan-Soo, Kwon, Hyuk-Min, Kim, Tae-Woo
Published in Materials (01.09.2023)
Published in Materials (01.09.2023)
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Correlation between low-frequency noise and interface traps of fully-depleted silicon-on-insulator tunneling FETs induced by hot carrier stress
Shin, Hyun-Jin, Song, Hyun-Dong, Song, Hyeong-Sub, Eadi, Sunil Babu, Choi, Hyun-Woong, Kim, Seong-Hyun, Kim, Do-Woo, Lee, Hi-Deok, Kwon, Hyuk-Min
Published in Japanese Journal of Applied Physics (01.10.2020)
Published in Japanese Journal of Applied Physics (01.10.2020)
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A Study on Dominant Mechanism and Analytical Model of Low-Frequency Noise in FD-SOI pTFET
Shin, Hyun-Jin, Eadi, Sunil Babu, Kim, Seong-Hyun, Ryu, Tae-Gyu, An, Yeong-Jin, Kim, Do-Woo, Lee, Hi-Deok, Kwon, Hyuk-Min
Published in IEEE journal of the Electron Devices Society (2022)
Published in IEEE journal of the Electron Devices Society (2022)
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A Correlation Between Oxygen Vacancies and Reliability Characteristics in a Single Zirconium Oxide Metal-Insulator-Metal Capacitor
Hyuk-Min Kwon, Sung-Kyu Kwon, Kwang-Seok Jeong, Sung-Kwen Oh, Sun-Ho Oh, Woon-Il Choi, Tae-Woo Kim, Dae-Hyun Kim, Chang-Yong Kang, Byoung Hun Lee, Kirsch, Paul, Hi-Deok Lee
Published in IEEE transactions on electron devices (01.08.2014)
Published in IEEE transactions on electron devices (01.08.2014)
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