Product Reliability Methods to Enable High Performance CPU's
Rechter, Roman, Kwasnick, Robert, Reshef, Almog, Zonensain, Oren, Raz, Tal, Rahman, Anisur, Polasam, Praveen, Levit, Maxim
Published in 2019 IEEE International Reliability Physics Symposium (IRPS) (01.03.2019)
Published in 2019 IEEE International Reliability Physics Symposium (IRPS) (01.03.2019)
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Conference Proceeding
Setting use conditions for reliability modeling
Kwasnick, Robert, Polasam, Praveen, Lucero, Alan
Published in 2014 IEEE International Reliability Physics Symposium (01.06.2014)
Published in 2014 IEEE International Reliability Physics Symposium (01.06.2014)
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Conference Proceeding
Advanced methods for CPU product reliability modeling and enhancement
Zonensain, Oren, Rechter, Roman, Kwasnick, Robert, Park, Keun Woo, Rahman, Anisur, Reshef, Almog, Raz, Tal, Levit, Maxim
Published in 2020 IEEE International Reliability Physics Symposium (IRPS) (01.04.2020)
Published in 2020 IEEE International Reliability Physics Symposium (IRPS) (01.04.2020)
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Conference Proceeding
Platform qualification methodology: Face recognition
Antanius, Ghadeer, Trivedi, Rutvi, Kwasnick, Robert
Published in 2015 IEEE International Reliability Physics Symposium (01.04.2015)
Published in 2015 IEEE International Reliability Physics Symposium (01.04.2015)
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Conference Proceeding
Telemetry for reliability
Kwasnick, Robert, Karayacoubian, Paul, Polasam, Praveen, Wang, Anna, Biswas, Arijit, Tayeb, Jamel, Mattani, Ravi, Arbab, Bijan
Published in 2017 IEEE International Reliability Physics Symposium (IRPS) (01.04.2017)
Published in 2017 IEEE International Reliability Physics Symposium (IRPS) (01.04.2017)
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Conference Proceeding
Time-ordered events CPU reliability assessment
Sauciuc, Ioan, Kwasnick, Robert, Akhter, Roksana, Ojha, Manas, Tse, Maritza, Mani, Divya, Beas, Carlos, Kaur, Gurindeijit
Published in 2016 IEEE International Reliability Physics Symposium (IRPS) (01.04.2016)
Published in 2016 IEEE International Reliability Physics Symposium (IRPS) (01.04.2016)
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Conference Proceeding
Determination of CPU use conditions
Kwasnick, R, Papathanasiou, A E, Reilly, M, Rashid, A, Zaknoon, B, Falk, J
Published in 2011 International Reliability Physics Symposium (01.04.2011)
Published in 2011 International Reliability Physics Symposium (01.04.2011)
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Conference Proceeding
Impact of VLSI technology scaling on HTOL
Kwasnick, R., Reilly, M., Hatfield, J., Johnson, S. C., Rahman, A.
Published in 2012 IEEE International Reliability Physics Symposium (IRPS) (01.04.2012)
Published in 2012 IEEE International Reliability Physics Symposium (IRPS) (01.04.2012)
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Conference Proceeding
Methods and apparatus to optimize a guard band of a hardware resource
Zand, William, Tschanz, James, Kang, Xin, Taha, Ali, Kwasnick, Robert, Khanna, Rahul
Year of Publication 29.10.2024
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Year of Publication 29.10.2024
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