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A 90 nm 1.8 V 512 Mb Diode-Switch PRAM With 266 MB/s Read Throughput

A 90 nm 1.8 V 512 Mb Diode-Switch PRAM With 266 MB/s Read Throughput

by LEE, Kwang-Jin, CHO, Beak-Hyung, PARK, Mu-Hui, RO, Yu-Hwan, CHOI, Joon-Yong, KIM, Ki-Sung, KIM, Young-Ran, SHIN, In-Cheol, LIM, Ki-Won, CHO, Ho-Keun, CHOI, Chang-Han, CHUNG, Won-Ryul, CHO, Woo-Yeong, KIM, Du-Eung, YOON, Yong-Jin, YU, Kwang-Suk, JEONG, Gi-Tae, JEONG, Hong-Sik, KWAK, Choong-Keun, KIM, Chang-Hyun, KIM, Kinam, KANG, Sangbeom, CHOI, Byung-Gil, OH, Hyung-Rok, LEE, Chang-Soo, KIM, Hye-Jin, PARK, Joon-Min, QI WANG
Published in IEEE journal of solid-state circuits (01.01.2008)

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Journal Article Conference Proceeding

Enhanced write performance of a 64-mb phase-change random access memory

Enhanced write performance of a 64-mb phase-change random access memory

by OH, Hyung-Rok, CHO, Beak-Hyung, JEONG, Gi-Tae, JEONG, Hong-Sik, KIM, Kinam, WOO YEONG CHO, KANG, Sangbeom, CHOI, Byung-Gil, KIM, Hye-Jin, KIM, Ki-Sung, KIM, Du-Eung, KWAK, Choong-Keun, BYUN, Hyun-Geun
Published in IEEE journal of solid-state circuits (01.01.2006)

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A 0.1-μm 1.8-V 256-Mb phase-change random access memory (PRAM) with 66-MHz synchronous burst-read operation

A 0.1-μm 1.8-V 256-Mb phase-change random access memory (PRAM) with 66-MHz synchronous burst-read operation

by KANG, Sangbeom, WOO YEONG CHO, YU HWAN RO, KIM, Suyeon, HA, Choong-Duk, KIM, Ki-Sung, KIM, Young-Ran, KIM, Du-Eung, KWAK, Choong-Keun, BYUN, Hyun-Geun, JEONG, Gitae, JEONG, Hongsik, CHO, Beak-Hyung, KIM, Kinam, SHIN, Yunsueng, LEE, Kwang-Jin, LEE, Chang-Soo, OH, Hyung-Rok, CHOI, Byung-Gil, QI WANG, KIM, Hye-Jin, PARK, Mu-Hui
Published in IEEE journal of solid-state circuits (2007)

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Conference Proceeding Journal Article

$A 0.1- \mu} 1.8-V 256-Mb Phase-Change Random Access Memory (PRAM) With 66-MHz Synchronous Burst-Read Operation$

A 0.1- \mu} 1.8-V 256-Mb Phase-Change Random Access Memory (PRAM) With 66-MHz Synchronous Burst-Read Operation

by Sangbeom Kang, Woo Yeong Cho, Beak-Hyung Cho, Kwang-Jin Lee, Chang-Soo Lee, Hyung-Rok Oh, Byung-Gil Choi, Qi Wang, Hye-Jin Kim, Mu-Hui Park, Yu Hwan Ro, Suyeon Kim, Choong-Duk Ha, Ki-Sung Kim, Young-Ran Kim, Du-Eung Kim, Choong-Keun Kwak, Hyun-Geun Byun, Gitae Jeong, Hongsik Jeong, Kinam Kim, Shin, Y.
Published in IEEE journal of solid-state circuits (01.01.2007)

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Journal Article

Processor-Based Built-in Self-Optimizer for 90nm Diode-Switch PRAM

Processor-Based Built-in Self-Optimizer for 90nm Diode-Switch PRAM

by Kyomin Sohn, Hyejung Kim, Jerald Yoo, Jeong-Ho Woo, Seung-Jin Lee, Woo-Yeong Cho, Bo-Tak Lim, Byung-Gil Choi, Chang-Sik Kim, Choong-Keun Kwak, Chang-Hyun Kim, Hoi-Jun Yoo
Published in 2007 IEEE Symposium on VLSI Circuits (01.06.2007)

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Conference Proceeding

COLUMN DECODER CIRCUIT OF SEMICONDUCTOR MEMORY DEVICE, ESPECIALLY REDUCING CHIP SIZE BY USING FOUR NOR GATES

COLUMN DECODER CIRCUIT OF SEMICONDUCTOR MEMORY DEVICE, ESPECIALLY REDUCING CHIP SIZE BY USING FOUR NOR GATES

by CHOI, BYUNG GIL, KWAK, CHOONG KEUN
Year of Publication 14.01.2005

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Patent

INPUT BUFFER OF SEMICONDUCTOR MEMORY DEVICE

INPUT BUFFER OF SEMICONDUCTOR MEMORY DEVICE

by KWAK, CHOONG-KEUN, SHIN, INNOL
Year of Publication 10.10.1996

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Patent

DATA OUTPUT BUFFER

DATA OUTPUT BUFFER

by KWAK, CHOONG-KEUN, HAN, KYO-JIN
Year of Publication 15.06.2000

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Patent

SEMICONDUCTOR DEVICE AND BURN-IN METHOD

SEMICONDUCTOR DEVICE AND BURN-IN METHOD

by KWAK, CHOONG-KEUN, LEE, SEUNG-KEUN
Year of Publication 30.06.1997

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Patent

COLUMN REDUNDANCY CIRCUIT OF SEMICONDUCTOR MEMORY DEVICE

COLUMN REDUNDANCY CIRCUIT OF SEMICONDUCTOR MEMORY DEVICE

by KWAK, CHOONG-KEUN, CHON, TAE-SOO
Year of Publication 28.06.1997

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Patent

REDUNDANCY CIRCUIT OF SEMICONDUCTOR MEMORY DEVICE PROVIDED WITH MULTI-BLOCK STRUCTURES, ESPECIALLY REDUCING OCCUPATION AREA OF CHIP

REDUNDANCY CIRCUIT OF SEMICONDUCTOR MEMORY DEVICE PROVIDED WITH MULTI-BLOCK STRUCTURES, ESPECIALLY REDUCING OCCUPATION AREA OF CHIP

by CHOI, BYUNG GIL, KIM, DU EUNG, KWAK, CHOONG KEUN
Year of Publication 17.01.2005

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Patent

ADDRESS INPUT BUFFER CIRCUIT

ADDRESS INPUT BUFFER CIRCUIT

by KWAK, CHOONG - KEUN, KIM, DO - EUNG
Year of Publication 20.06.1996

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Patent

A 0.18-μm 3.0-V 64-Mb nonvolatile phase-transition random access memory (PRAM)

A 0.18-μm 3.0-V 64-Mb nonvolatile phase-transition random access memory (PRAM)

by WOO YEONG CHO, CHO, Beak-Hyung, HWANG, Youngnam, AHN, Sujin, KOH, Gwan-Hyeob, JEONG, Gitae, JEONG, Hongsik, KIM, Kinam, CHOI, Byung-Gil, OH, Hyung-Rok, KANG, Sangbeom, KIM, Ki-Sung, KIM, Kyung-Hee, KIM, Du-Eung, KWAK, Choong-Keun, BYUN, Hyun-Geun
Published in IEEE journal of solid-state circuits (2005)

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Conference Proceeding Journal Article

A 0.18-/spl mu/m 3.0-V 64-Mb nonvolatile phase-transition random access memory (PRAM)

A 0.18-/spl mu/m 3.0-V 64-Mb nonvolatile phase-transition random access memory (PRAM)

by Cho, Woo Yeong, Cho, Beak-Hyung, Byung-Gil Choi, Hyung-Rok Oh, Kang, Sangbeom, Ki-Sung, Kim, Kim, Kyung-Hee, Du-Eung, Kim, Kwak, Choong-Keun, Hyun-Geun Byun, Hwang, Youngnam, Ahn, S, Koh, Gwan-Hyeob, Jeong, Gitae, Jeong, Hongsik, Kim, Kinam
Published in IEEE journal of solid-state circuits (01.01.2005)

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Journal Article

A 0.18-[micro]m 3.0-V 64-Mb nonvolatile phase-transition random access memory (PRAM)

A 0.18-[micro]m 3.0-V 64-Mb nonvolatile phase-transition random access memory (PRAM)

by Cho, Woo Yeong, Cho, Beak-Hyung, Choi, Byung-Gil, Oh, Hyung-Rok, Kang, Sangbeom, Kim, Ki-Sung, Kim, Kyung-Hee, Kim, Du-Eung, Kwak, Choong-Keun, Byun, Hyun-Geun, Hwang, Youngnam, Ahn, S, Koh, Gwan-Hyeob, Jeong, Gitae, Jeong, Hongsik, Kim, Kinam
Published in IEEE journal of solid-state circuits (01.01.2005)

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Journal Article

A 0.18-/spl mu/m 3.0-V 64-Mb nonvolatile phase-transition random access memory (PRAM)

A 0.18-/spl mu/m 3.0-V 64-Mb nonvolatile phase-transition random access memory (PRAM)

by Woo Yeong Cho, Beak-Hyung Cho, Byung-Gil Choi, Hyung-Rok Oh, Sangbeom Kang, Ki-Sung Kim, Kyung-Hee Kim, Du-Eung Kim, Choong-Keun Kwak, Hyun-Geun Byun, Youngnam Hwang, Ahn, S., Gwan-Hyeob Koh, Gitae Jeong, Hongsik Jeong, Kinam Kim
Published in IEEE journal of solid-state circuits (01.01.2005)

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Journal Article

A 90nm 1.8V 512Mb Diode-Switch PRAM with 266MB/s Read Throughput

A 90nm 1.8V 512Mb Diode-Switch PRAM with 266MB/s Read Throughput

by Lee, Kwang-Jin, Cho, Beak-Hyung, Cho, Woo-Yeong, Kang, Sangbeom, Choi, Byung-Gil, Oh, Hyung-Rok, Lee, Chang-Soo, Kim, Hye-Jin, Park, Joon-Min, Wang, Qi, Park, Mu-Hui, Ro, Yu-Hwan, Choi, Joon-Yong, Kim, Ki-Sung, Kim, Young-Ran, Shin, In-Cheol, Lim, Ki-Won, Cho, Ho-Keun, Choi, Chang-Han, Chung, Won-Ryul, Kim, Du-Eung, Yu, Kwang-Suk, Jeong, Gi-Tae, Jeong, Hong-Sik, Kwak, Choong-Keun, Kim, Chang-Hyun, Kim, Kinam
Published in 2007 IEEE International Solid-State Circuits Conference. Digest of Technical Papers (01.02.2007)

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Conference Proceeding

A 0.18μm 3.0V 64Mb non-volatile phase-transition random-access memory (PRAM)

A 0.18μm 3.0V 64Mb non-volatile phase-transition random-access memory (PRAM)

by WOO YEONG CHO, CHO, Beak-Hyung, HWANG, Young-Nam, AHN, Su-Jin, JUNG, Gi-Tae, JUNG, Hong-Sik, KIM, Kinam, CHOI, Byung-Gil, OH, Hyung-Rok, KANG, Sang-Beom, KIM, Ki-Sung, KIM, Kyung-Hee, KIM, Du-Eung, KWAK, Choong-Keun, BYUN, Hyun-Geun
Year of Publication 2004

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Conference Proceeding

Enhanced write performance of a 64 Mb phase-change random access memory

Enhanced write performance of a 64 Mb phase-change random access memory

by Hyung-rok On, Beak-hyung Cho, Woo Yeong Cho, Sangbeom Kang, Byung-gil Choi, Hye-jin Kim, Ki-sung Kim, Du-eung Kim, Choong-keun Kwak, Hyun-geun Byun, Gi-tae Jeong, Hong-silk Jeong, Kinam Kim
Published in ISSCC. 2005 IEEE International Digest of Technical Papers. Solid-State Circuits Conference, 2005 (2005)

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Conference Proceeding

A 0.1/spl mu/m 1.8V 256Mb 66MHz Synchronous Burst PRAM

A 0.1/spl mu/m 1.8V 256Mb 66MHz Synchronous Burst PRAM

by Sangbeom Kang, WooYeong Cho, Beak-Hyung Cho, Kwang-Jin Lee, Chang-Soo Lee, Hyung-Rock Oh, Byung-Gil Choi, Qi Wang, Hye-Jin Kim, Mu-Hui Park, Yu-Hwan Ro, Suyeon Kim, Du-Eung Kim, Kang-Sik Cho, Choong-Duk Ha, Youngran Kim, Ki-Sung Kim, Choong-Ryeol Hwang, Choong-Keun Kwak, Hyun-Geun Byun, Yun Sueng Shin
Published in 2006 IEEE International Solid State Circuits Conference - Digest of Technical Papers (2006)

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