METHOD AND DEVICE FOR MEASURING SURFACE STRUCTURE OF OBJECT IN NEAR FIELD AREA
LEE KWEN-JIN, PENG MING-TSAN, CHANG CHI-SHEN, HUANG HAI-JO, KUO JI-WEN, WU CHUN-TE, LEE YUANIN, JU JAU-JIU, WANG SHYH-JIER, JENG TZUAN-REN
Year of Publication 01.11.2007
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Year of Publication 01.11.2007
Patent
METHOD AND APPARATUS FOR MEASURING SURFACE STRUCTURE OF A NEAR-FIELD OBJECT
LEE KWEN-JIN, PENG MING-TSAN, CHANG CHI-SHEN, HUANG HAI-JO, KUO JI-WEN, WU CHUN-TE, LEE YUANIN, JU JAU-JIU, WANG SHYH-JIER, JENG TZUAN-REN
Year of Publication 18.10.2007
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Year of Publication 18.10.2007
Patent
Method and apparatus for measuring a surface structure a near-field object
PENG, MING TSAN, JENG, TZUAN-REN, WANG, SHYH-JIER, KUO, JI WEN, WU, CHUN TE, HUANG, HAI-JO, CHANG, CHI-SHEN, JU, JAU-JIU, LEE, YUAN CHIN, LEE, KWEN JIN
Year of Publication 16.10.2007
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Year of Publication 16.10.2007
Patent