A 45 nm Stacked CMOS Image Sensor Process Technology for Submicron Pixel
Takahashi, Seiji, Huang, Yi-Min, Sze, Jhy-Jyi, Wu, Tung-Ting, Guo, Fu-Sheng, Hsu, Wei-Cheng, Tseng, Tung-Hsiung, Liao, King, Kuo, Chin-Chia, Chen, Tzu-Hsiang, Chiang, Wei-Chieh, Chuang, Chun-Hao, Chou, Keng-Yu, Chung, Chi-Hsien, Chou, Kuo-Yu, Tseng, Chien-Hsien, Wang, Chuan-Joung, Yaung, Dun-Nien
Published in Sensors (Basel, Switzerland) (05.12.2017)
Published in Sensors (Basel, Switzerland) (05.12.2017)
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Journal Article
Adjusting Quality Control Chart Limits for WBC, RBC, Hb, and PLT Counts to Reduce Daily Control Risks in Hospital Laboratory
Liao, Chen-Mao, Lin, Chih-Ming, Kuo, Chin-Chia, Chen, Ming-Shu, Huang, Chun-Yang, Lin, Ching-Yuan
Published in Risk management and healthcare policy (01.01.2020)
Published in Risk management and healthcare policy (01.01.2020)
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Journal Article
Growth and Characteristics of a-Plane GaN on ZnO Heterostructure
Huang, Huei-Min, Kuo, Chin-Chia, Chang, Chiao-Yun, Lin, Yuan-Ting, Lu, Tien-Chang, Tu, Li-Wei, Hsieh, Wen-Feng
Published in Journal of the Electrochemical Society (01.01.2012)
Published in Journal of the Electrochemical Society (01.01.2012)
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Journal Article
The effect of thermal annealing on the optical and electrical properties of ZnO epitaxial films grown on n-GaAs (001)
Liu, Wei-Rein, Lin, Bi-Hsuan, Lin, Chi-Yuan, Yang, Song, Kuo, Chin-Chia, Shih-Sen Chien, Forest, Chang, Chen-Shiung, Hsu, Chia-Hung, Hsieh, Wen-Feng
Published in RSC advances (01.01.2015)
Published in RSC advances (01.01.2015)
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Journal Article
BACKSIDE DIODE DESIGN
CHEN HUA MAO, KUO CHIN CHIA, HUANG KUO CHIN, YAMASHITA YUICHIRO, WANG TZU JUI
Year of Publication 02.09.2022
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Year of Publication 02.09.2022
Patent
An objective-free outlying point detection model in data envelopment analysis
Kuo, Chin-Chia, Chen, Wen-Chih
Published in Journal of the Chinese Institute of Industrial Engineers (01.07.2010)
Published in Journal of the Chinese Institute of Industrial Engineers (01.07.2010)
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Journal Article
TRENCH ISOLATION SRTUCTURE FOR IMAGE SENSORS
HUANG CHENG YU, CHOU KENG YU, CHUANG CHUN HAO, WU WEN HAU, CHEN HUA MAO, KUO CHIN CHIA, CHANG CHIH KUNG, CHIANG WEI CHIEH
Year of Publication 22.07.2022
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Year of Publication 22.07.2022
Patent
ELFR experiment test verifying anomaly of nano-DRAM products in W-plug process
Chiao-Lo Chiang, Mu-Chun Wang, Yu-Min Chung, Chung-Ming Chu, Shou-Kong Fan, Chin-Chia Kuo, I-Shan Yen
Published in 2010 International Symposium on Next Generation Electronics (01.11.2010)
Published in 2010 International Symposium on Next Generation Electronics (01.11.2010)
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Conference Proceeding
DEVICE CRACK-STOP STRUCTURE TO PREVENT DAMAGE DUE TO DICING CRACK
Liu, Jen-Cheng, Wu, Tung-Ting, Wang, Chen-Jong, Kuo, Chin-Chia, Huang, Yimin
Year of Publication 24.10.2024
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Year of Publication 24.10.2024
Patent
Device crack-stop structure to prevent damage due to dicing crack
Liu, Jen-Cheng, Wu, Tung-Ting, Wang, Chen-Jong, Kuo, Chin-Chia, Huang, Yimin
Year of Publication 06.08.2024
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Year of Publication 06.08.2024
Patent