The efficient simulation of coupled point defect and impurity diffusion
Kump, M.R., Dutton, R.W.
Published in IEEE transactions on computer-aided design of integrated circuits and systems (01.02.1988)
Published in IEEE transactions on computer-aided design of integrated circuits and systems (01.02.1988)
Get full text
Journal Article
Field distribution and avalanche breakdown of trench MOS capacitors operated in deep depletion
Bulucea, C., Kump, M.R., Amberiadis, K.
Published in IEEE transactions on electron devices (01.11.1989)
Published in IEEE transactions on electron devices (01.11.1989)
Get full text
Journal Article
g-r noise spectra of semiconductors and insulators with various trap distributions
Amberiadis, Kostas, Grimes, Rodney W., Kump, Michael R.
Published in Solid-state electronics (01.07.1990)
Published in Solid-state electronics (01.07.1990)
Get full text
Journal Article
Process design using two-dimensional process and device simulators
Daeje Chin, Kump, M.R., Hee-Gook Lee, Dutton, R.W.
Published in IEEE transactions on electron devices (01.02.1982)
Published in IEEE transactions on electron devices (01.02.1982)
Get full text
Journal Article
Comparison of phosphorus, arsenic and boron implants into bulk silicon and SOS
Amberiadis, Kostas, Kump, Michael R., Magee, Charles W.
Published in Solid-state electronics (01.06.1990)
Published in Solid-state electronics (01.06.1990)
Get full text
Journal Article
Process design using coupled 2D process and device simulators
Chin, D.J., Kump, M.R., Lee, H.G., Dutton, R.W.
Published in 1980 International Electron Devices Meeting (1980)
Published in 1980 International Electron Devices Meeting (1980)
Get full text
Conference Proceeding