Progress, Challenges, and Opportunities in Oxide Semiconductor Devices: A Key Building Block for Applications Ranging from Display Backplanes to 3D Integrated Semiconductor Chips
Kim, Taikyu, Choi, Cheol Hee, Hur, Jae Seok, Ha, Daewon, Kuh, Bong Jin, Kim, Yongsung, Cho, Min Hee, Kim, Sangwook, Jeong, Jae Kyeong
Published in Advanced materials (Weinheim) (01.10.2023)
Published in Advanced materials (Weinheim) (01.10.2023)
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Journal Article
Revival of Ferroelectric Memories Based on Emerging Fluorite-Structured Ferroelectrics
Park, Ju Yong, Choe, Duk-Hyun, Lee, Dong Hyun, Yu, Geun Taek, Yang, Kun, Kim, Se Hyun, Park, Geun Hyeong, Nam, Seung-Geol, Lee, Hyun Jae, Jo, Sanghyun, Kuh, Bong Jin, Ha, Daewon, Kim, Yongsung, Heo, Jinseong, Park, Min Hyuk
Published in Advanced materials (Weinheim) (01.10.2023)
Published in Advanced materials (Weinheim) (01.10.2023)
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Journal Article
Revival of Ferroelectric Memories Based on Emerging Fluorite‐Structured Ferroelectrics (Adv. Mater. 43/2023)
Park, Ju Yong, Choe, Duk‐Hyun, Lee, Dong Hyun, Yu, Geun Taek, Yang, Kun, Kim, Se Hyun, Park, Geun Hyeong, Nam, Seung‐Geol, Lee, Hyun Jae, Jo, Sanghyun, Kuh, Bong Jin, Ha, Daewon, Kim, Yongsung, Heo, Jinseong, Park, Min Hyuk
Published in Advanced materials (Weinheim) (01.10.2023)
Published in Advanced materials (Weinheim) (01.10.2023)
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Journal Article
Specific contact resistivity reduction in amorphous IGZO thin-film transistors through a TiN/IGTO heterogeneous interlayer
Jeong, Joo Hee, Seo, Seung Wan, Kim, Dongseon, Yoon, Seong Hun, Lee, Seung Hee, Kuh, Bong Jin, Kim, Taikyu, Jeong, Jae Kyeong
Published in Scientific reports (13.05.2024)
Published in Scientific reports (13.05.2024)
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Journal Article
Composition control of conformal crystalline GeSbTe films by atomic layer deposition supercycles and tellurization annealing
Kim, Yewon, Kim, Kwonyoung, Kim, Okhyeon, Park, Chang Yup, Koo, Dong Geon, Ahn, Dong-Ho, Kuh, Bong Jin, Lee, Won-Jun
Published in Journal of materials chemistry. C, Materials for optical and electronic devices (07.07.2022)
Published in Journal of materials chemistry. C, Materials for optical and electronic devices (07.07.2022)
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Journal Article
Self-Aligned in 2Pitch Cell Array Transistor (S2CAT) for 4F2 Based DRAM Generation Extension
Park, Seokhan, Oh, Gyuhwan, Yoo, Bowon, Jeong, Moonyoung, Lee, Kiseok, Lee, Sangho, Hong, Seongbin, Sung, Sang Hyun, Choi, Hyungeun, Jo, Taegeun, Jang, Wonchul, Park, Jaekyun, Park, Sangwuk, Yun, Hyunchul, Kim, Jinbum, Jang, Sunghwan, Kuh, Bong-Jin, Kim, Ilgweon, Oh, Jeonghoon, Han, Jin-Woo, Park, Jemin
Published in 2023 International Electron Devices Meeting (IEDM) (09.12.2023)
Published in 2023 International Electron Devices Meeting (IEDM) (09.12.2023)
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Conference Proceeding
Correction: Composition control of conformal crystalline GeSbTe films by atomic layer deposition supercycles and tellurization annealing
Kim, Yewon, Kim, Kwonyoung, Kim, Okhyeon, Park, Chang Yup, Koo, Dong Geon, Ahn, Dong-Ho, Kuh, Bong Jin, Lee, Won-Jun
Published in Journal of materials chemistry. C, Materials for optical and electronic devices (18.08.2022)
Published in Journal of materials chemistry. C, Materials for optical and electronic devices (18.08.2022)
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Journal Article
A Comprehensive Study of Read-After-Write-Delay for Ferroelectric VNAND
Myeong, Ilho, Lim, Suhwan, Kim, Taeyoung, Park, Sanghyun, Noh, Suseong, Lee, Seung Min, Woo, Jongho, Ko, Hanseung, Noh, Youngji, Choi, Munkang, Lee, Kiheun, Han, Sangwoo, Baek, Jongyeon, Kim, Kijoon, Jung, Dongjin, Kim, Jisung, Park, Jaewoo, Kim, Seunghyun, Kim, Hyoseok, Yoon, Ilyounz, Kim, Jaeho, Kim, Kwangsoo, Park, Kwangmin, Kuh, Bong Jin, Kim, Wanki, Ha, Daewon, Ahn, Sujin, Song, Jaihyuk, Yoo, Sijung, Lee, Hyun Jae, Choe, Duk-Hyun, Nam, Seung-Geol, Heo, Jinseong
Published in 2024 IEEE International Reliability Physics Symposium (IRPS) (14.04.2024)
Published in 2024 IEEE International Reliability Physics Symposium (IRPS) (14.04.2024)
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Conference Proceeding
Drain Current Degradation Induced by Charge Trapping/De-Trapping in Fe-FET
Kim, Taeyoung, Lim, Suhwan, Myeong, Ilho, Park, Sanghyun, Noh, Suseong, Lee, Seung Min, Woo, Jongho, Ko, Hanseung, Noh, Youngji, Choi, Moonkang, Lee, Kiheun, Han, Sangwoo, Baek, Jongyeon, Kim, Kijoon, Jung, Dongjin, Kim, Ji-sung, Park, Jaewoo, Kim, Seunghyun, Kim, Hyoseok, Yoo, Sijung, Lee, Hyun Jae, Choe, Duk-Hyun, Nam, Seung-Geol, Yoon, Ilyoung, Kim, Chaeho, Kim, Kwanzsoo, Park, Kwanzmin, Kuh, Bong Jin, Heo, Jinseong, Kim, Wanki, Ha, Daewon, Song, Jaihyuk
Published in 2024 IEEE International Reliability Physics Symposium (IRPS) (14.04.2024)
Published in 2024 IEEE International Reliability Physics Symposium (IRPS) (14.04.2024)
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Conference Proceeding
Integrated Circuit device
KUH BONG JIN, WOO DONG SOO, KIM BONG SOO, KIM YOON JAE, PARK JOON SOO
Year of Publication 01.04.2024
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Year of Publication 01.04.2024
Patent
Thin film structure and semiconductor device comprising the same
KUH BONG JIN, KIM, JUNG HWA, LEE, SANG JUN, LEE EUN HA, NAM GAB JIN, LEE, HYANG SOOK
Year of Publication 14.09.2023
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Year of Publication 14.09.2023
Patent
SEMICONDUCTOR DEVICE
KUH BONG JIN, CHOI WON HEE, LEE KONG SOO, SHIN DONG SUK, JANG SUNG UK
Year of Publication 14.04.2023
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Year of Publication 14.04.2023
Patent
SEMICONDUCTOR DEVICE
KUH BONG JIN, PARK JIN HONG, SEO SEUNG HWAN, KOO JI WAN, LEE JU HEE, ANDREEV MAKSIM, HONG SA HWAN
Year of Publication 21.09.2023
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Year of Publication 21.09.2023
Patent
SEMICONDUCTOR DEVICE
KUH BONG JIN, PARK JIN HONG, CHOI JAE WOONG, SEO SEUNG HWAN, KOO JI WAN, KANG JUN CHEOL, AHN HO GEUN, HONG SA HWAN
Year of Publication 10.10.2023
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Year of Publication 10.10.2023
Patent
First demonstration of 3-dimensional stacked FET with top/bottom source-drain isolation and stacked n/p metal gate
Park, Jaehyun, Kim, Wukang, Park, Sungil, Yun, Jinchan, Hwang, Kyuman, Yang, Jinwook, Kim, Dahye, Jeong, Jae Won, Yun, Chuljin, Bae, Jinho, Park, Jejune, Park, Sam, Huh, Woong, Huh, Daihong, Yang, Suk, Lee, Junghan, Seo, Jaehoon, Kim, Ajeong, Oh, Kyungseok, Yoo, Donggon, Kuh, Bong Jin, Ha, Daewon, Shin, Yu Gyun, Song, Jaihyuk
Published in 2023 International Electron Devices Meeting (IEDM) (09.12.2023)
Published in 2023 International Electron Devices Meeting (IEDM) (09.12.2023)
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Conference Proceeding