Measurement method of three-dimensional profiles and reconstruction system thereof using subpixel localization with color gratings and picture-in-picture switching on single display
Lin, Chern-Sheng, Lee, Jyh-Fa, Yeh, Mau-Shiun, Lin, Chia-Hau, Ku, Shih-Liang
Year of Publication 06.01.2009
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Year of Publication 06.01.2009
Patent