Approaches toward ultralarge FPDs: Flat-panel display technology
KRUSIUS, J. Peter, SERAPHIM, Donald P, GREENE, Raymond G, SKINNER, Dean S, YOST, Boris
Published in Proceedings of the IEEE (2002)
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Published in Proceedings of the IEEE (2002)
Journal Article
Physical design alternatives for RISC workstation packaging
O'Brien, D.E., Hahne, B.M., Krusius, J.P.
Published in IEEE transactions on components, hybrids, and manufacturing technology (01.12.1993)
Published in IEEE transactions on components, hybrids, and manufacturing technology (01.12.1993)
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Journal Article
CMOS shallow-trench-isolation to 50-nm channel widths
VanDerVoom, P., Gan, D., Krusius, J.P.
Published in IEEE transactions on electron devices (01.06.2000)
Published in IEEE transactions on electron devices (01.06.2000)
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Journal Article
Approaches toward ultralarge FPDs
Krusius, J.P., Seraphim, D.P., Greene, R.G., Skinner, D.S., Yost, B.
Published in Proceedings of the IEEE (01.04.2002)
Published in Proceedings of the IEEE (01.04.2002)
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Journal Article
Associate editors, guest editors, and reviewers
Published in IEEE transactions on advanced packaging
(01.05.2001)
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Journal Article
Editor's statement
Krusius, J. Peter
Published in IEEE transactions on components, packaging, and manufacturing technology. Part B, Advanced packaging (01.11.1998)
Published in IEEE transactions on components, packaging, and manufacturing technology. Part B, Advanced packaging (01.11.1998)
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Journal Article
Correction to "1997 list of reviewers"
Krusius, J. Peter
Published in IEEE transactions on components, packaging, and manufacturing technology. Part B, Advanced packaging (01.11.1998)
Published in IEEE transactions on components, packaging, and manufacturing technology. Part B, Advanced packaging (01.11.1998)
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Journal Article
Spin-on-glass for 200 nm trench isolation structures
Lutze, J W, Shacham-Diamand, Y Y, Krusius, J P
Published in Journal of micromechanics and microengineering (01.03.1991)
Published in Journal of micromechanics and microengineering (01.03.1991)
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Journal Article
Series resistance of silicided ohmic contacts for nanoelectronics
Chieh, Y.-S., Perera, A.K., Krusius, J.P.
Published in IEEE transactions on electron devices (01.08.1992)
Published in IEEE transactions on electron devices (01.08.1992)
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Journal Article