Darkfield colors from multi-periodic arrays of gap plasmon resonators
Ng, Ray Jia Hong, Krishnan, Ravikumar Venkat, Wang, Hao, Yang, Joel K.W.
Published in Nanophotonics (Berlin, Germany) (01.02.2020)
Published in Nanophotonics (Berlin, Germany) (01.02.2020)
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Journal Article
Erratum to: Darkfield colors from multi-periodic arrays of gap plasmon resonators
Ng, Ray Jia Hong, Krishnan, Ravikumar Venkat, Wang, Hao, Yang, Joel K.W.
Published in Nanophotonics (Berlin, Germany) (01.11.2020)
Published in Nanophotonics (Berlin, Germany) (01.11.2020)
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Journal Article
Characterization of 1122nm Laser for Laser Based Fault Isolation Applications
Somasundaram, Vasanth, Xuan, Seah Yi, Phoa, Angeline, Lua, Winson, Meng, Chua Choon, Krishnan Ravikumar, Venkat
Published in 2019 IEEE 26th International Symposium on Physical and Failure Analysis of Integrated Circuits (IPFA) (01.07.2019)
Published in 2019 IEEE 26th International Symposium on Physical and Failure Analysis of Integrated Circuits (IPFA) (01.07.2019)
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Conference Proceeding
TR-DLS analysis on analog circuit
Lua, Winson, Phoa, Angeline, Ranganathan, Gopinath, A.S., Girish, Ravikumar, Venkat Krishnan, Tan, Abel
Published in Microelectronics and reliability (01.03.2020)
Published in Microelectronics and reliability (01.03.2020)
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Journal Article
Timing analysis case studies using 1064 nm Continuous Wave laser for Fault Isolation on scan failures
Ranganathan, Gopinath, Ravikumar, Venkat-Krishnan, Phoa, Angeline, Chea-Wei Teo
Published in 2015 IEEE 22nd International Symposium on the Physical and Failure Analysis of Integrated Circuits (01.06.2015)
Published in 2015 IEEE 22nd International Symposium on the Physical and Failure Analysis of Integrated Circuits (01.06.2015)
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Conference Proceeding
Micro-tags for art: covert visible and infrared images using gap plasmons in native aluminum oxide
Ng, Ray Jia Hong, Krishnan, Ravikumar Venkat, Dong, Zhaogang, Ho, Jinfa, Liu, Hailong, Ruan, Qifeng, Pey, Kin Leong, Yang, Joel K. W.
Published in Optical materials express (01.02.2019)
Published in Optical materials express (01.02.2019)
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Journal Article
Low Frequency Detector for Enhanced Laser Voltage Probing and Imaging Applications at Slow Speeds
Lua, Winson, Ravikumar, Venkat Krishnan, Phoa, Angeline
Published in 2018 IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA) (01.07.2018)
Published in 2018 IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA) (01.07.2018)
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Conference Proceeding
ELECTRO-OPTIC WAVEFORM ANALYSIS PROCESS
YANG, Joel Kwang Wei, RAVIKUMAR, Venkat Krishnan, CHIN, Jiann Min, PEY, Kin Leong
Year of Publication 13.03.2024
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Year of Publication 13.03.2024
Patent
Root Cause Analysis on Analog Circuit Using TR-LADA
Winson, Lua, Angeline, Phoa, Ranganathan, Gopinath, Girish, AS, Krishnan, Ravikumar Venkat
Published in 2019 IEEE 26th International Symposium on Physical and Failure Analysis of Integrated Circuits (IPFA) (01.07.2019)
Published in 2019 IEEE 26th International Symposium on Physical and Failure Analysis of Integrated Circuits (IPFA) (01.07.2019)
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Conference Proceeding
ELECTRO-OPTIC WAVEFORM ANALYSIS PROCESS
YANG, Joel Kwang Wei, RAVIKUMAR, Venkat Krishnan, CHIN, Jiann Min, PEY, Kin Leong
Year of Publication 23.11.2022
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Year of Publication 23.11.2022
Patent
ELECTRO-OPTIC WAVEFORM ANALYSIS PROCESS
YANG, Joel Kwang Wei, RAVIKUMAR, Venkat Krishnan, CHIN, Jiann Min, PEY, Kin Leong
Year of Publication 03.08.2022
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Year of Publication 03.08.2022
Patent
Combinational logic analysis case studies using laser voltage probing
Winson Lua, Ranganathan, Gopinath, Ravikumar, Venkat Krishnan, Phoa, Angeline
Published in 2016 IEEE 23rd International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA) (01.07.2016)
Published in 2016 IEEE 23rd International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA) (01.07.2016)
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Conference Proceeding
Electro-optic waveform analysis process
Ravikumar, Venkat Krishnan, Wei, Joel Yang Kwang, Chin, Jiann Min, Leong, Pey Kin
Year of Publication 21.09.2021
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Year of Publication 21.09.2021
Patent
ELECTRO-OPTIC WAVEFORM ANALYSIS PROCESS
RAVIKUMAR, Venkat Krishnan, CHIN, Jiann Min, LEONG, Pey Kin, WEI, Joel Yang Kwang
Year of Publication 01.04.2021
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Year of Publication 01.04.2021
Patent
ELECTRO-OPTIC WAVEFORM ANALYSIS PROCESS
Ravikumar, Venkat Krishnan, Wei, Joel Yang Kwang, Chin, Jiann Min, Leong, Pei Kin
Year of Publication 01.04.2021
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Year of Publication 01.04.2021
Patent
Systematic root cause analysis of metal defects in FINFET devices
Lua, Winson, Soon-Huat Lim, Ravikumar, Venkat Krishnan, Phoa, Angelina
Published in 2017 IEEE 24th International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA) (01.07.2017)
Published in 2017 IEEE 24th International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA) (01.07.2017)
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Conference Proceeding
ANALYSIS OF ELECTRO-OPTIC WAVEFORMS
Ravikumar, Venkat Krishnan, Chin, Jiann Minn, Linarto, Nathan, Hong, Abel Tan Yew, Phoa, Shei Lay, Lua, Wen Tsann, Ranganathan, Gopinath
Year of Publication 25.03.2021
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Year of Publication 25.03.2021
Patent
Probe placement for laser probing system
Ravikumar, Venkat Krishnan, Linarto, Nathan, Chin, Jiann Min, Seah, Yi Xuan, Phoa, Shei Lay, Lua, Wen Tsann, Ranganathan, Gopinath
Year of Publication 08.09.2020
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Year of Publication 08.09.2020
Patent